[1]
T.V. L'vova, I.A. Andreev, E.V. Kunitsyna, M.P. Mikhailova, V.P. Ulin, Yu. P. Yakovlev, IEEE Proc. Optoelectron. Vol. 145, (1998), p.303.
Google Scholar
[2]
M. Razeghi, Opto-Electronics Review, Vol. 7 No. 1, (1999), p.29.
Google Scholar
[3]
A. Joullie, P. Christol, C.R. Physique, Vol. 4, (2003), p.621.
Google Scholar
[4]
T.T. Piotrowski, A. Piotrowska, E. Kamińska,K. Gołaszewska, E. Papis, M. Piskorski, J. Kątcki, J. Piotrowski, Z. Orman, Z. Nowak, Opto-Electronics Review, Vol. 9, No. 2, (2001), p. 188F.
DOI: 10.1016/s0042-207x(00)00116-0
Google Scholar
[5]
C. Agert, R. Beckert, V. Hinkov, O.V. Sulima, A.W. Bett, Proceedings of 17 th European Photovoltaic Solar Energy Conference and Exhibition, Munich, (2001).
Google Scholar
[6]
J.G. Cederberg, M.J. Hafich, R.M. Biefeld, M. Palmisiano, Journal of Crystal Growth, Vol. 248, (2003), p.289.
Google Scholar
[7]
M. Grudzień, J. Piotrowski: Infrared Phys. Vol. 29, (1989), p.251.
Google Scholar
[8]
M. Edward Motamedi: Optical Engineering, Vol. 33, (1994), pp.3505-10.
Google Scholar
[4]
0 GaSb in BCl3 plasma P = 30 W p = 60 µbar T = 60 oC Depth of etching (nm) Time of etching (min. ) 0 10 20 30 40 50 60.
Google Scholar
[1]
6 Power (W) Depth of etching (nm) GaSb in BCl3 plasma Ar/(BCl3+Ar) = 0. 35 p = 60 µbar T = 60 oC t = 2 min.
Google Scholar
0 0. 2 0. 4 0. 6 0. 8 1. 0 1. 2.
Google Scholar
[3]
0 Depth of etching (nm) GaSb in BCl3 plasma P = 30 W p = 60 µbar T = 60 oC t = 2 min. Gas flow ratio Ar/(BCl3+Ar) 50 µm 5 µm a) b) c) Fig. 6. SEM micrographs of GaSb circular grating fabricated by e-beam lithography and RIE in BCl3 - based plasma. Magnitude of a) 350x, b) 3500x.
DOI: 10.1016/s0038-1101(99)00303-2
Google Scholar