Fabrication of GaSb Microlenses by Photo and E-Beam Lithography and Dry Etching

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Abstract:

Fabrication of surface-relief microstructures in GaSb for application in mid-infrared optoelectronic devices is described. Photo- and e-beam lithography was used to define patterns on GaSb surfaces. Ar/O2 sputter etching and RIE in BCl3-based plasma were applied to transfer preshaped master into the GaSb substrate. Circular microlenses with an aspect ratio (height to diameter) 0.4/10 µm and circular gratings with 0.4 µm linewidth / 1 µm period and 1.7 µm depth have been demonstrated.

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Solid State Phenomena (Volumes 99-100)

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83-88

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July 2004

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© 2004 Trans Tech Publications Ltd. All Rights Reserved

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[1] T.V. L'vova, I.A. Andreev, E.V. Kunitsyna, M.P. Mikhailova, V.P. Ulin, Yu. P. Yakovlev, IEEE Proc. Optoelectron. Vol. 145, (1998), p.303.

Google Scholar

[2] M. Razeghi, Opto-Electronics Review, Vol. 7 No. 1, (1999), p.29.

Google Scholar

[3] A. Joullie, P. Christol, C.R. Physique, Vol. 4, (2003), p.621.

Google Scholar

[4] T.T. Piotrowski, A. Piotrowska, E. Kamińska,K. Gołaszewska, E. Papis, M. Piskorski, J. Kątcki, J. Piotrowski, Z. Orman, Z. Nowak, Opto-Electronics Review, Vol. 9, No. 2, (2001), p. 188F.

DOI: 10.1016/s0042-207x(00)00116-0

Google Scholar

[5] C. Agert, R. Beckert, V. Hinkov, O.V. Sulima, A.W. Bett, Proceedings of 17 th European Photovoltaic Solar Energy Conference and Exhibition, Munich, (2001).

Google Scholar

[6] J.G. Cederberg, M.J. Hafich, R.M. Biefeld, M. Palmisiano, Journal of Crystal Growth, Vol. 248, (2003), p.289.

Google Scholar

[7] M. Grudzień, J. Piotrowski: Infrared Phys. Vol. 29, (1989), p.251.

Google Scholar

[8] M. Edward Motamedi: Optical Engineering, Vol. 33, (1994), pp.3505-10.

Google Scholar

[4] 0 GaSb in BCl3 plasma P = 30 W p = 60 µbar T = 60 oC Depth of etching (nm) Time of etching (min. ) 0 10 20 30 40 50 60.

Google Scholar

[1] 6 Power (W) Depth of etching (nm) GaSb in BCl3 plasma Ar/(BCl3+Ar) = 0. 35 p = 60 µbar T = 60 oC t = 2 min.

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0 0. 2 0. 4 0. 6 0. 8 1. 0 1. 2.

Google Scholar

[3] 0 Depth of etching (nm) GaSb in BCl3 plasma P = 30 W p = 60 µbar T = 60 oC t = 2 min. Gas flow ratio Ar/(BCl3+Ar) 50 µm 5 µm a) b) c) Fig. 6. SEM micrographs of GaSb circular grating fabricated by e-beam lithography and RIE in BCl3 - based plasma. Magnitude of a) 350x, b) 3500x.

DOI: 10.1016/s0038-1101(99)00303-2

Google Scholar