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The ZnO nanopowders synthesized by the chemical process have large numbers of reports.
It found that all the diffraction peaks can be indexed according to ZnO crystal, which is the hexagonal wurtzite structure, and match well with the standard hexagonal ZnO (JCPDS Card No.75-0576).
(a), (b), (c) in fig.2 are pure ZnO, Al doped ZnO and Al-In co-doped ZnO, respectively.
However, it is resulted that large number acid radical ions (NO3-and Cl-) are present in the solution.
The tested wave number is in the range of 4000~400 cm-1 and the resolution is 5 cm-1 with the high-purity KBr tablet.

This is in good agreement with the Joint Committee of Powder Diffraction Standards (JCPDS) card number 04-0835 as shown in figure 2.
Fig. 2 (JCPDS) card number 04-0835.
The optical band gap for the prepared films was obtained by using Tauc’s equation (2) Where A is a constant, is the absorption coefficient, is the photon energy and n is a number depends on the nature of the optical transition.
Boudine, Effect of copper doping on the photocatalytic activity of ZnO thin films prepared by sol–gel method, Superlattices Microstruct. 88 (2015) 315–322
Aydemir, Effects of withdrawal speed on the microstructural and optical properties of sol-gel grown ZnO:Al thin films, Vacuum. 120 (2015) 51–58.

Using the KOH as the etchant the ZnO microrods have etched into ZnO microtubes.
Introduction There are large numbers of wide band metal oxide such as TiO2, ZnO, SnO2, ZrO2 and NiO which are potentially used in wide range of applications [1].
(a,b) ZnO MRs, (c,d) ZnO MTs etched for 4hours, (e,f) ZnO MTS etched for 12hours.
XRD spectrum well matches with the standard JCPDS card no 3614516.
Photocatalytic degradiation of pure MB, MB with ZnO MRs and MB with ZnO MTs as catalyst Conclusion The ZnO MTs are formed by the etching of ZnO MRs using KOH as the etching precursor.

There were several reports of thermal oxidation of sputtered Zn3N2 film into nitrogen doped ZnO (ZnON) [6-9].
JCPDS card no. 01-075-1526 and 01-088-0618 was used as reference to identify ZnO and Zn3N2 phases respectively.
Absence of Zn3N2 peaks in the annealed films indicates that these films have been fully transformed into ZnO [10].
(1) where I(hkl) is the relative intensity of the plane (hkl), Io(hkl) is the standard relative intensity of particular plane (hkl) from the reference ZnO data and n is the number of plane(hkl) have been measured.
The strain (ε) induced along the c-axis was stated in Eq. 3 as c-c0/c0, where c is the lattice constant of the ZnO film and c0 is the lattice constant in the unstrained ZnO (c = 5.2065Å).

All peaks of this XRD pattern can be indexed as those of standard wurtzite (hexagonal) ZnO, consistent with the standard ZnO powder values from the JCPDS card (65-3411) with space group P63mc.
Once the prototype of ZnO nucleus occurred, the final ZnO product with a certain morphology was then formed.
Therefore, to obtain T-ZnO, the ZnO nucleus composed of eight pyramidal inversion-twin crystals was required.
So, the nucleus of T-ZnO was possibly formed on which four legs of ZnO then growed.
Acknowledgements This work was financially supported by the National Natural Science Foundation of China under grant number 50774014, and the project of “863 Plan of China” under grant number 2008AA03Z514.

Nano-ZnO catalyst preparation and characterization.
Fig.1(a) was the SEM image of nano-ZnO powder.
It shows that a large number of spherical and distributed nanoparticles appeared evenly, nanoparticles diameter of nano-ZnO was around 10-30 nm.
In this study, it had been observed that all samples exhibited a hexagonal structure in accordance with the JCPDS database of card number 36–1451 in Fig.
Effect of dosage of nano-ZnO on the removal of ammonia-N.

The ZnO nanoparticles were settled down.
XRD: From the diffraction spectra shown in Figure 1, it could be seen that the diffraction peaks are more intensive and narrower implying a good crystalline nature of the as-synthesized ZnO product and all of the peaks can be well indexed to hexagonal phase ZnO reported in JCPDS card (NO 36-1451).
SEM OF ZNO NANOPARTICLES. 3.2.
(7) In these relations, Z is the number of nearest neighbouring chains (~4), k is Boltzmann constant and N(EF) the density of states per electron volt (2-ring unit suggested for PANI)[28].
Conclusion ZnO nanoparticles and PANI-ZnO nanocomposites have been successfully synthesized.

For Cu-ZnO molar ratios (0.02:1, 0.05:1, 0.08:1, 0.1:1) it was observed that with increasing the Cu concentration, the intensity of diffraction peaks corresponding to face centered cubic structure of Cu (marked with ‘◆’) increased, while compared to pure ZnO with hexagonal wurtzite structure (JCPDS card# 36-1451, a=3.25 Å and c=5.21 Å).
And Cu-ZnO nanoparticles has better antibacterial activities than pure ZnO.
Fig. 5 Antibacterial activity of blank (a), ZnO (b), Cu-ZnO (0.02:1) (c), Cu-ZnO (0.05:1) (d), Cu-ZnO (0.08:1) (e), Cu-ZnO (0.1:1) (f) against E. coli and S. aureus.
Sample Viable bacterial number/ CFU/ml Antibacterial rate (%) E. coli S. aureus E. coli S. aureus Blank 4.2×105 6.2×105 / / mPET-0 fiber 3.6×105 5.1×105 14.2 17.3 mPET-1 fiber 2.36×104 2.69×104 94.3 95.6 mPET-2 fiber 2.05×104 2.41×104 95.1 96.1 mPET-3 fiber 1.54×104 1.65×104 96.3 97.3 mPET-4 fiber 1.19×104 1.17×104 97.1 98.1 Conclusions Cu-ZnO nanoparticles has been synthesized through sol-gel method.
And Cu-ZnO nanoparticles has better antibacterial activities than pure ZnO.

The pure ZnO displayed the typical wurtzite structure according to the standardized JCPDS card.
Fig. 2 HR-TEM images (a) pure ZnO; (b) 2.0 mol% thiourea/ZnO The UV-Vis absorption spectroscopy of pure ZnO and 2.0 mol% thiourea/ZnO was shown in Fig. 3.
The generated electron-hole pairs had higher oxidation-reduction ability, although the numbers were lesser than that of pure ZnO.
Fig. 3 The UV-Vis spectra of pure ZnO and 2.0 mol% thiourea/ZnO Chemical compositions of pure ZnO and 2.0 mol% thiourea/ZnO were determined by XPS spectra.
(line a = ZnO; line b = 2.0 mol% thiourea/ZnO).

The XRD pattern of the unheated sample as shown in Fig. 3 displays only four prominent peaks at 35.670, 41.530, 50.760, 60.440, corresponding to the (200), (210), (211), and (310) crystallographic planes respectively, with relatively lower intensities (JCPDS card no: 41-1445).
Additionally, two peaks of Sn at 30.220, 45.320 were observed, corresponding to the (200) and (211) planes respectively (JCPDS card no: 04-0673).
In contrast, the XRD pattern of the annealed sample as referred in Fig. 4 exhibits distinct peaks corresponding to SnO2 crystallographic planes of (101), (111), (220), (301), and (202) at 32.750, 38.140, 57.770, 67.850, 71.790, respectively (JCPDS card no: 41-1445).
Furthermore, a significant peak associated with Sn (220) was observed at 44.010 (JCPDS card no: 89-4898).
Representation of various parameters analyzed through XRD Sample Number Avg.