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Online since: March 2007
Authors: Murray W. Mahoney, William H. Bingel, Christian B. Fuller, B. London, Michael Calabrese
Acknowledgments
The authors acknowledge the financial support of the Defense Advanced Research Projects
Agency (DARPA), under contract No.
The cooperation and support of the friction stir group at NSWCCD and the Advanced Joining Center at SDSMT (Bill Arbegast and Casey Allen) are gratefully acknowledged.
Lynch: "Friction Stir Processing", Welding Technology Institute of Australia, 51st Annual Conf., Paper No. 23, Surface Engineering Conf.
Forum, Vols. 426432 (2003), p. 2891
Forum, Vols. 426-432 (2003), p. 2903
The cooperation and support of the friction stir group at NSWCCD and the Advanced Joining Center at SDSMT (Bill Arbegast and Casey Allen) are gratefully acknowledged.
Lynch: "Friction Stir Processing", Welding Technology Institute of Australia, 51st Annual Conf., Paper No. 23, Surface Engineering Conf.
Forum, Vols. 426432 (2003), p. 2891
Forum, Vols. 426-432 (2003), p. 2903
Online since: October 2006
Authors: Michel Pons, Shin Ichi Nishizawa
From the engineering point of view, SiC hot-wall epitaxy is a very important process in
SiC semiconductor processes.
The requirements for the epitaxial process strongly depend on the devices, so there are many investigations from fundamental to engineering levels.
Design of Engineering Epitaxial Reactor.
From the engineering points of view, it is necessary to keep good uniformity of both epitaxial layer thickness and doping concentration, inside a wafer and between wafers.
In the experiment, there are lots of investigations that try to understand the fundamental processes and also try to develop engineering reactors.
The requirements for the epitaxial process strongly depend on the devices, so there are many investigations from fundamental to engineering levels.
Design of Engineering Epitaxial Reactor.
From the engineering points of view, it is necessary to keep good uniformity of both epitaxial layer thickness and doping concentration, inside a wafer and between wafers.
In the experiment, there are lots of investigations that try to understand the fundamental processes and also try to develop engineering reactors.
Online since: January 2013
Authors: Alla A. Sitnikova, Marina G. Mynbaeva, Vassili N. Petrov, Demid A. Kirilenko, Irina S. Kotousova, Alexander Smirnov, Alexander A. Lavrent'ev, Sergey P. Lebedev
The feasibility of porous SiC for bio–engineering has been shown in pioneering works by A.J.
Saddow, Silicon carbide biotechnology: biocompatible semiconductor for advanced biomedical devices and applications, Elsevier, Amsterdam, 2012
Gorga, Nanofibrous composites for tissue engineering applications, WIREs Nanomed.
Forum 527–529 (2006) 751–754
Forum 483–485 (2004) 269–272
Saddow, Silicon carbide biotechnology: biocompatible semiconductor for advanced biomedical devices and applications, Elsevier, Amsterdam, 2012
Gorga, Nanofibrous composites for tissue engineering applications, WIREs Nanomed.
Forum 527–529 (2006) 751–754
Forum 483–485 (2004) 269–272
Online since: March 2010
Authors: Xi Fa Yu, Ci Xiang Li, Jing Lin, Su Jun Yi
Introduction
Reverse engineering, as an emerging discipline, is more and more importance to advanced
manufacturing techniques.
Physical model measurenment & planning Digital measurement Data Preprocessing digital discrete data of Physical model Fig. 3 Process of physical digitalize Physical surface digitalize is the basis of reverse engineering, in the past, we mainly use calipers to measuring by hand, which is not only inefficient but also error-prone, so it is replaced by advanced modern measuring instruments and specialized computer software.
TRACECUT is the core software of various scanning system in RENISHAW company and it is also a CAD/CAM package with advanced scanning/digital function.
Li: Proceeding of 2004 national doctoral academic forum and essay.
Zhang: China Mechanical Engineering, Vol. 6 (1995), p. 1-5 [6] G.C.
Physical model measurenment & planning Digital measurement Data Preprocessing digital discrete data of Physical model Fig. 3 Process of physical digitalize Physical surface digitalize is the basis of reverse engineering, in the past, we mainly use calipers to measuring by hand, which is not only inefficient but also error-prone, so it is replaced by advanced modern measuring instruments and specialized computer software.
TRACECUT is the core software of various scanning system in RENISHAW company and it is also a CAD/CAM package with advanced scanning/digital function.
Li: Proceeding of 2004 national doctoral academic forum and essay.
Zhang: China Mechanical Engineering, Vol. 6 (1995), p. 1-5 [6] G.C.
Online since: November 2011
The First International Conference on materials and Applications for Sensors and
Transducers (ICMAST) aims to provide a high-level international forum for scientists,
engineers, and educators to present the state of the art of materials technology and
especially those materials used for sensors, actuators, and all kind of devices used for
transducing physical signals.
Popescu, editor of the Journal of Optoelectronics and Advanced Materials, and Prof D.
Hristoforou, National Technical University of Athens, School of Mining and Metallurgy Engineering D.
Popescu, Editor-in-Chief, Journal of Optoelectronics and Advanced Materials P.
Popescu, Editor-in-Chief, Journal of Optoelectronics and Advanced Materials R.
Popescu, editor of the Journal of Optoelectronics and Advanced Materials, and Prof D.
Hristoforou, National Technical University of Athens, School of Mining and Metallurgy Engineering D.
Popescu, Editor-in-Chief, Journal of Optoelectronics and Advanced Materials P.
Popescu, Editor-in-Chief, Journal of Optoelectronics and Advanced Materials R.
Online since: May 2012
Authors: Yu Hu
Network Management System on Engineering Training Room
HU Yu
Chongqing Water Recourse and Electric Engineering College, 402160, China
cqcshy@yeah.net
Keywords: Network Management, Training Room, Management System
Abstract.
The system has some feature, such as advanced technology, friendly interface, strong interaction ability, simple operation and high application.
The system adopts the idea of software engineering and is divided into five modules.
Fortunately, this test offers a way of making use of advanced computer network technology to create a network management system, through which students across China can be directed, supervised, and controlled easily .Due to the help of this system, practice quality and assessment and process management can be conducted to improve conditions of practice management.
Lee, et al: Smart home–digitally engineered domestic life.
The system has some feature, such as advanced technology, friendly interface, strong interaction ability, simple operation and high application.
The system adopts the idea of software engineering and is divided into five modules.
Fortunately, this test offers a way of making use of advanced computer network technology to create a network management system, through which students across China can be directed, supervised, and controlled easily .Due to the help of this system, practice quality and assessment and process management can be conducted to improve conditions of practice management.
Lee, et al: Smart home–digitally engineered domestic life.
Online since: January 2022
Authors: Xiong Zhang, Zi Li Wu, Xiang Hua Zeng, Qian Dai
Enhanced Performance of the Non-Polar Ultraviolet Light-Emitting Diodes with Lattice-Matched Quaternary Quantum Barriers
Qian Dai1,a,*, Xiong Zhang2,b, Zili Wu2,c and Xianghua Zeng3,d
1School of Network and Communication Engineering, Jinling Institute of Technology, Nanjing, Jiangsu, China
2Advanced Photonics Center, School of Electronic Science and Engineering, Southeast University, Nanjing, Jiangsu, China
3College of Physics Science and Technology, Yangzhou University, Yangzhou, Jiangsu, China
adaiqian@jit.edu.cn, bxzhang62@aliyun.com, c230189117@seu.edu.cn, dxhzeng@yzu.edu.cn
Keywords: non-polar AlGaN-based UV-LED, AlInGaN quaternary barriers, lattice match, internal quantum efficiency
Abstract.
In this paper, the electrical and optical characteristics of a non-polar a-plane AlGaN-based UV-LED with lattice matched quantum barriers along the [1-100] direction were intensively analyzed with the advanced physical model of semiconductor devices (APSYS) simulation program.
Forum Vol. 68 (1996) p. 40 [20] Y.
Forum Vol. 158 (2011) p.
Forum Vol. 117 (2020) p. 012105.
In this paper, the electrical and optical characteristics of a non-polar a-plane AlGaN-based UV-LED with lattice matched quantum barriers along the [1-100] direction were intensively analyzed with the advanced physical model of semiconductor devices (APSYS) simulation program.
Forum Vol. 68 (1996) p. 40 [20] Y.
Forum Vol. 158 (2011) p.
Forum Vol. 117 (2020) p. 012105.
Online since: August 2014
Authors: Athanasios G. Mamalis
Shock Loading of Advanced Materials from Macro-, Micro- to Nanoscale
Academician Prof.
Mamalis Project Center for Nanotechnology and Advanced Engineering, NCSR “Demokritos”, Greece mamalis@ims.demokritos.gr Abstract.
Some of the activities of the Project Center for Nanotechnology and Advanced Engineering (PC-NAE), a joint initiative of the Greek National Center for Scientific Research “Demokritos” and the Russian Research Center “Kurchatov Institute”, in advanced manufacturing engineering are briefly outlined, focusing onto some recent trends and developments in manufacturing from macro-, micro-, to nanoscale of advanced materials in the important engineering topics nowadays from industrial, research and academic point of view: nanotechnology/ultraprecision engineering and advanced materials under shock loading, with industrial applications to net-shape manufacturing, bioengineering, energy and transport.
Development of manufacture engineering is related to the tendency to miniaturization and is accompanied by the continuous increasing of the accuracy of the manufactured parts.
Forum Vol.673 (2011), p.131
Mamalis Project Center for Nanotechnology and Advanced Engineering, NCSR “Demokritos”, Greece mamalis@ims.demokritos.gr Abstract.
Some of the activities of the Project Center for Nanotechnology and Advanced Engineering (PC-NAE), a joint initiative of the Greek National Center for Scientific Research “Demokritos” and the Russian Research Center “Kurchatov Institute”, in advanced manufacturing engineering are briefly outlined, focusing onto some recent trends and developments in manufacturing from macro-, micro-, to nanoscale of advanced materials in the important engineering topics nowadays from industrial, research and academic point of view: nanotechnology/ultraprecision engineering and advanced materials under shock loading, with industrial applications to net-shape manufacturing, bioengineering, energy and transport.
Development of manufacture engineering is related to the tendency to miniaturization and is accompanied by the continuous increasing of the accuracy of the manufactured parts.
Forum Vol.673 (2011), p.131
Online since: February 2014
Preface
The 2013 International Forum on Computer and Information Technology (IFCIT 2013)
was held in Shenzhen, China, 24-25 December 2013.
The IFCIT2013 brought together scientists and researchers from 12 countries, affiliated with universities, technology centers and industrial firms to debate topics related to advanced technologies for computer application and information technology application, which would enhance the sustainable development of this field.
The technical papers included in this volume on the following topics: Databases, Data Processing and Data Management, Parallel and Distributed Computing, Computer Network Technology and Applications, Software Engineering, E-Commerce and E-Government, Multimedia Technology and Application, Computer Vision and Image Processing Technology, Artificial Intelligence, Intelligent Algorithms and Computational Mathematics, Computer Aided Design and Research, Communications Technology and Signal Processing, Electronic Devices and Embedded Systems, Intelligent Instruments, Techniques for Detection and Testing, Sensors and Measurement, Automation and Control, Information Technologies in Engineering Management, Enterprise Resource Planning and Management System, Information Technologies in Education, etc.
We sincerely hope that the 2013 International Forum on Computer and Information Technology is a significant step forward.
(ID: 212.3.110.94-03/03/14,10:09:30)2013 International Forum on Computer and Information Technology (IFCIT 2013) Conference Organization Co-Chairmen Prof.
The IFCIT2013 brought together scientists and researchers from 12 countries, affiliated with universities, technology centers and industrial firms to debate topics related to advanced technologies for computer application and information technology application, which would enhance the sustainable development of this field.
The technical papers included in this volume on the following topics: Databases, Data Processing and Data Management, Parallel and Distributed Computing, Computer Network Technology and Applications, Software Engineering, E-Commerce and E-Government, Multimedia Technology and Application, Computer Vision and Image Processing Technology, Artificial Intelligence, Intelligent Algorithms and Computational Mathematics, Computer Aided Design and Research, Communications Technology and Signal Processing, Electronic Devices and Embedded Systems, Intelligent Instruments, Techniques for Detection and Testing, Sensors and Measurement, Automation and Control, Information Technologies in Engineering Management, Enterprise Resource Planning and Management System, Information Technologies in Education, etc.
We sincerely hope that the 2013 International Forum on Computer and Information Technology is a significant step forward.
(ID: 212.3.110.94-03/03/14,10:09:30)2013 International Forum on Computer and Information Technology (IFCIT 2013) Conference Organization Co-Chairmen Prof.
Online since: September 2013
Authors: Zhi Gang Wang, Ke Gao Liu, Min Jing, Teng Teng Yao
Forum Vol. 15(2006), p. 95
Forum Vol.58( 2007), p. 1133
Forum Vol.213(2004), p. 198
Forum Vol. 37(2004), p.325
Estreicher: Advanced Materials Research.
Forum Vol.58( 2007), p. 1133
Forum Vol.213(2004), p. 198
Forum Vol. 37(2004), p.325
Estreicher: Advanced Materials Research.