Search Options

Sort by:

Sort search results by

Publication Type:

Publication Type filter

Open access:

Publication Date:

Periodicals:

Periodicals filter

Search results

Online since: December 2012
Authors: Rameshwar Rao, K. Venkateswara Rao, V. Rajendar
Results and Discussion X-Ray diffraction (XRD): Internsity(a.u) 20 30 40 50 60 70 80 (1 0 1) (1 0 0) U0A100 U20A80 U80A20 U60A40 U40A60 U100A0 2θ (degree) ZnO - JCPDF Card number 36-1451 (0 0 2) (1 0 2) (2 0 2) (1 0 3) (1 1 2) (2 0 0) (2 0 1) (1 1 0) Fig 1.
It can be observed that very intense single hexagonal ZnO phase with P63mc structure (JCPDS 36-1451) has been obtained.
Online since: September 2013
Authors: Shan Shan Wu, Xiu Feng Xiao, Qiu Ling Yao, Xiao Xuan Lin, Xuan Qin
All the peaks can be readily indexed by the standard HA (JCPDS card No. 09-432) without other phases being detected.
Fig. 4b shows when added 0.01% CAPB,HA began to generate a large number of spherical rudiment.
Online since: June 2014
Authors: Chesta Ruttanapun, Aree Wichainchai, Chalermpol Rudradawong, Aparporn Sakulkalavek, Yuttana Hongaromkid
The first step, the polycrystalline of CuFeO2 samples examined by XRD measurements, the XRD patterns of all CuFeO2 exhibited in the Fig. 1 shows phases of 3R-CuFeO2 type by confirmed by standard JCPDS card number 39-0246.
Online since: May 2012
Authors: Iftichar Us Salam, Muhammad Khalid, Mohammad Mujahid, Khalid Mehmood, Rajdeep Singh Rawat, Aamer Nusair Khan
In this regard, the coating sprayed at 350 A (Fig. 5a) showed maximum number of non-melted particles.
JCPDS cards used for phase identification of α-Al2O3, γ-Al2O3 and δ- Al2O3 were 43-1484, 29-0063 and 16-0394 respectively.
Online since: September 2011
Authors: Hui Xu, Yuan Guo Xu, Shuo Wiei Zhao, Hua Ming Li
It could be seen that all the diffraction peaks could be indexed to monoclinic Ag3VO4 according to JCPDS card no. 43-0542.
The excess Co (>1 wt.%) covering on the surface of Ag3VO4 could increase the number of recombination centers, so decreased photocatalytic activity.
Online since: April 2023
Authors: Bandana Gogoi, Upamanyu Das
These large numbers are due to their ability to coordinate with different charges present in the molecular structure.
FTIR spectroscopic data were recorded using the Thermo Fisher Scientific–Nicolet iS5 spectrometer in the range of wave numbers 4000 to 400 cm-1.
The diffraction peaks are very well fit with PDF Card 85-1436, which shows inverse spinel structure with face-centered cubical symmetry.
Further, the diffraction peaks of the entire samples shift slightly towards the higher 2θ angle side (right side) as compared to JCPDS file 19-0629.
The synthesized magnetite spinel nanoparticles show absorption bands at wave numbers 3440, 2960 (very weak), 2370 (for HPMC and PVA coated), 1660, 1430, 1060, and 605 cm-1, and many small absorption peaks in the wave number range 600–1660 cm-1.
Online since: October 2024
Authors: Muhammad Abid Amin, Azaz Nigah, Muhammad Ali
The X-ray diffraction patterns were confirmed by JCPDS cards, the card numbers 79-2264, 35-0734, and 35-790 were in accordance with BaTiO3, SrTiO3, and CaZrO3 respectively.
Online since: February 2011
Authors: Ya Nan Sun, Xi Yu Ding, Li Na Du, Zhen Jiang, Hui Xu, Ya Biao Yu, Yang Li, Qi Qing Zhang
There were four peaks in the XRD pattern: (111), (200), (220) and (311), indicated that the products are face-centered cubic (fcc) structure (JCPDS card no. 04-0783).
The numbers of spheral gold particles are also more than it.
Online since: November 2012
Authors: L.N. Ismail, N.N. Hafizah, M.F. Achoi, M. Rusop
The results are proved with the standard JCPDS card 71-1169.
Wang et al also reported that the TiO2 submicrospheres in their studies showed Ti-O stretching mode shows higher wave number of 568 cm-1 [15].
Online since: February 2011
Authors: W. Wu, X.H. Xiao, T.C. Peng, C.Z. Jiang
Up to now, there are a great number of publications reported that the ZnO thin films grown onto the silicon, sapphire and glass substrates [10-12], but there are scarce reports described that the ZnO thin films grown onto the Ni layers.
Moreover, the spindle ZnO thin films on the Ni layers were possesses a polycrystalline wurtzite structure with a preferred (002) orientation and all peaks are in good agreement with the JCPDS card 36-1451.