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In: Journal of Advanced Manufacturing Systems, DOI: 10.1142/S0219686720500389, (2019) [2] W.
Engineering design: a systematic approach.
Research in Engineering Design 30(2) (2019) 271-289 [10] M.
Journal of Engineering Design. 29(2018) 20-40
The International Journal of Advanced Manufacturing Technology. 36 (2008) 833-843 [26] S.

Defect and Diffusion Forum, 413: 47–64. https://doi.org/10.4028/www.scientific.net/ ddf.413.47 [5] YarmolenkoM.
A comprehensive review on green perspectives of electrocoagulation integrated with advanced processes for effective pollutants removal from water environment.
Lecture Notes on Data Engineering and Communications Technologies, vol 178.

Comparative Evaluation of Daylighting Simulation Programs Lenka Gábrová1, a *, Michaela Hlásková1,b and František Vajkay1,c 1Brno University of Technology, Faculty of Civil Engineering, Institute of Building Structures, Veveří 331/95, 602 00 Brno, Czech Republic agabrova.l@fce.vutbr.cz, bhlaskova.m@fce.vutbr.cz, cvajkay.f@fce.vutbr.cz Keywords: Daylighting, daylighting simulations, CIE test cases, ray-tracing, radiosity.
LO1408 “AdMaS UP - Advanced Materials, Structures and Technologies”, supported by Ministry of Education, Youth and Sports under the “National Sustainability Programme I”.
[25] Information on http://forum.dial.de/viewtopic.php?

Acknowledgements The authors acknowledge the financial support of the Particle Engineering Research Center (PERC) at the University of Florida, The National Science Foundation (NSF Grant EEC-94-02989), and the Industrial Partners of the PERC.
Ertl: The Japan Chemical Journal Forum, Vol. 1 (2001), p. 33-45. 2.
Sigmund: Raman Spectroscopy of Anatase Coated Carbon Nanotubes. in 32nd International Conference & Exposition on Advanced Ceramics & Composites. 2008.

This volume will be helpful to many engineers in the chemical industry, geotechnics, machinery and power engineering.

Materials Science and Engineering 3157 Gilman Hall Iowa State University Ames, IA 50011-2300, USA bgleeson@iastate.edu; bingtaol@iastate.edu Keywords: Cyclic oxidation, life prediction, subsurface depletion, chromia scale, diffusion Abstract.
The numerical model used in this study gives an advanced method for predicting the subsurface Cr depletion profile during cyclic oxidation, in which interfacial Cr content also is obtained.
Forum Vol. 251-254 (1997), p. 57 [20] J.

Effect of the Nanostructures Addition on TiO2 Photoanode and DSSC Properties Bartłomiej Hrapkowicz1,a*, Kinga Jędrzejczak1,b Paweł Jarka1,c, Tomasz Tański1,d 1Silesian University of Technology, Department of Engineering Materials and Biomaterials, 44-100 Gliwice Konarskiego 18A, Poland aBartlomiej.hrapkowicz@polsl.pl, bKinga-jedrzejczak4@wp.pl, cPawel.jarka@polsl.pl, dTomasz.tanski@polsl.pl, Keywords: Photovoltaics, DSSCs, photoanode, TiO2 Abstract.
Recent advances in dye-sensitized solar cells: From photoanodes, sensitizers and electrolytes to counter electrodes.
In Proceedings of the Materials Science Forum; Trans Tech Publications Ltd, 2018; Vol. 913, pp. 1027–1032
Advances in high efficiency dye sensitized solar cells based on Ru(ii) free sensitizers and a liquid redox electrolyte.

SiC Migration Enhanced Embedded Epitaxial (ME 3 ) Growth Technology Y.Takeuchi1 , M.Kataoka1 , T.Kimoto2 , H.Matsunami3 and R.K.Malhan1 1 DENSO CORPORATION, Research Laboratories, Minamiyama, Nisshin, Aichi 470-0111, Japan 2 Dept. of Electronic Science and Engineering, Kyoto University, Katsura, Kyoto 615-8510, Japan 3 Japan Science and Technology Agency, Ohara Goryo, Nishikyo, Kyoto 615-8245, Japan E-mail: yuuichi_takeuchi@denso.co.jp Keywords: Embedded Epitaxy, Migration, pn-junction diode, and Junction Field Effect Transistor, Abstract.
Amarayunga: 3rd International Conference on Material and Advanced Technologies, Singapore (2005)
Forum Vols. 457-460 (2004), p.189

Measurement of the Thermal Properties of Innovative Highly-Insulating Non-Structural Concretes Milena Kušnerová1,a*, Marta Harničárová1,2b, Jan Valíček1,2c, Zuzana Palková1,2,d, Zdenko Tkáč2,e, Anton Panda3,f, Jan Kmec1,g and Ondrej Lukáč2, h 1Department of Mechanical Engineering, Faculty of Technology, Institute of Technology and Business in České Budějovice, Okružní 10, 370 01 České Budějovice, Czech Republic 2Technical Faculty, Slovak University of Agriculture in Nitra, Tr.
Altenbach (Eds.), Advanced Structures materials, Springer Singapore, 2015, pp. 155-165
Koštial, Comparative measurements of the thermal properties of solid materials on a new device and using a new non-stationary method, Def Diff Forum 366 (2016) 366, 63-72

Morisette1,e∗ 1School of Electrical and Computer Engineering and Birck Nanotechnology Center Purdue University, West Lafayette, Indiana, USA 2Sonrisa Research, Inc., Santa Fe, New Mexico, USA a∗nopondo@purdue.edu, bcooperj@purdue.edu, cliao23@purdue.edu, dwchen@purdue.edu, emorisett@purdue.edu Keywords: Specific on­resistance, substrate resistance, Power MOSFETs.
One way to reduce the substrate resistance is to mechanically thin the substrate, and this is currently employed in the most advanced production devices [2].
Alquier, ICP etching of 4H­SiC substrates, Materials Science Forum, Trans Tech Publ, vol. 740 (2013) 825-828 [12] G.M.