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Online since: November 2012
Authors: Yue Qiang Qian, Li Wei Zhao, Fu Jun Liu
References
[1] Zhijun Yang, Guang Dai, Wei Li: Science and Engineering technology (In Chinese) Vol. 9 (2009), p. 5472
[2] Zhiping Liu, Yihua Kang, Xinjun Wu: Nondestructive Testing (In Chinese) Vol. 26 (2004), p. 612
[3] Feifei Yan: Tian Jian University 2008
[4] Charlton P C, Drury J C.: British Journal of Non-Destructive Testing Vol. 35 (1993), p. 119
[5] Ron Rials, Ty Hagen: Oil and Gas Journal Vol. 92 (1994), p. 74
[6] Stephen F, Mcjones: Cathodic & anodic protection Vol. 5 (1992), p. 25
[7] Michael B, Surkein, John Collins: Cathodis & anodic protection Vol. 5 (1996), p. 25
[8] American Petroleum Institute.
Online since: September 2020
Authors: Jia Xin Sun, Xin Gu, Bing Qin Zhou
Experimental
Silicon-rich silicon nitride thin films were deposited by PECVD technology using a PECVD- 400 RF plasma chemical vapor deposition instrument produced by Shen Yang technology Instrument Company.
[6] Zhang Shuliang, Yi Danian,Wu Tianning.
[6] Zhang Shuliang, Yi Danian,Wu Tianning.
Online since: February 2018
Authors: Hong Xiang Wang, Yan Shen, Yi Peng Pan
Materials Science and Engineering: A, Volume 280, Issue 1, pp37-49
[5]Wang Ping, Wu Ting, Peng Hao, Guo Xiao Yang (2016).
Rare Metal Materials and Engineering, Volume 36, pp117-120 [10]Xiaohong Yao, Xiangyu Zhang, Haibo Wu, Linhai Tian, Yong Ma, Bin Tang (2014).
Rare Metal Materials and Engineering, Volume 36, pp117-120 [10]Xiaohong Yao, Xiangyu Zhang, Haibo Wu, Linhai Tian, Yong Ma, Bin Tang (2014).