Engineering Research
Advanced Engineering Forum
Applied Mechanics and Materials
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Engineering Innovations
Journal of Biomimetics, Biomaterials and Biomedical Engineering
International Journal of Engineering Research in Africa
Materials Science
Advanced Materials Research
Defect and Diffusion Forum
Diffusion Foundations and Materials Applications
Journal of Metastable and Nanocrystalline Materials
Journal of Nano Research
Key Engineering Materials
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Solid State Phenomena
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Books by Keyword: Atomic Force Microscope (AFM)
Books
Edited by:
Wei Gao, Yasuhiro Takaya, Yongsheng Gao and Michael Krystek
Online since: June 2008
Description: Volume is indexed by Thomson Reuters BCI (WoS).
Measurement, rigorously defined as ‘ascertaining the size, amount or degree of a measurand by instrumental comparison with a standard unit or by indirect calculation based upon theory’, is what makes science and technology different to imagination. Measurement is essential in industry, commerce and daily life. In the manufacturing industry in particular, measurement and instrumentation technology play increasingly important roles not only in the traditional field of manufacturing but also in the new fields of micro/nano technology and bioengineering.
This book presents recent advances in the use of measurement and instrumentation in the manufacturing industry. A wide range of topics are covered including: micro/nano-metrology，precision measurements，online and in-process measurements，surface metrology，optical metrology and image processing，bio-measurement, sensor technology，intelligent measurement and instrumentation，uncertainty, traceability and calibration and signal-processing algorithms.
Measurement, rigorously defined as ‘ascertaining the size, amount or degree of a measurand by instrumental comparison with a standard unit or by indirect calculation based upon theory’, is what makes science and technology different to imagination. Measurement is essential in industry, commerce and daily life. In the manufacturing industry in particular, measurement and instrumentation technology play increasingly important roles not only in the traditional field of manufacturing but also in the new fields of micro/nano technology and bioengineering.
This book presents recent advances in the use of measurement and instrumentation in the manufacturing industry. A wide range of topics are covered including: micro/nano-metrology，precision measurements，online and in-process measurements，surface metrology，optical metrology and image processing，bio-measurement, sensor technology，intelligent measurement and instrumentation，uncertainty, traceability and calibration and signal-processing algorithms.
Edited by:
Dr. David J. Fisher
Online since: March 2008
Description: Defect and Diffusion Forum Vol. 272
Edited by:
William Lau, Shang Huai Min, Lee Nam Sua, Ma Jan and Alfred Tok
Online since: February 2008
Description: Volume is indexed by Thomson Reuters CPCI-S (WoS).
This very special volume on ‘Advanced Structural and Functional Materials for Protection’ focuses on the choice of materials intended for the specific task of protecting civilians and soldiers against the effects of blast, fragmentation weapons and unconventional attacks, and also covers multi-functional materials intended for the enhancement of soldier performance. Protective materials represent one of the greatest challenges to synthesis and processing; due to the extreme requirements of the application.
This very special volume on ‘Advanced Structural and Functional Materials for Protection’ focuses on the choice of materials intended for the specific task of protecting civilians and soldiers against the effects of blast, fragmentation weapons and unconventional attacks, and also covers multi-functional materials intended for the enhancement of soldier performance. Protective materials represent one of the greatest challenges to synthesis and processing; due to the extreme requirements of the application.
Edited by:
N. Ali
Online since: January 2008
Description: This periodical edition includes peer-reviewed scientific and engineering papers on all aspects of research in the area of nanoscience and nanotechnologies and wide practical application of the achieved results.
Edited by:
S. J. CHUA, J. H. TENG, O. WADA, R. DE LA RUE and X. H. TANG
Online since: November 2007
Description: Volume is indexed by Thomson Reuters CPCI-S (WoS).
This book consists of a collection of 74 original peer-reviewed papers. They cover a wide range of topics in the interesting field of nano-structure related semiconductor photonics; a field which encompasses quantum dots, quantum wire, nano-wire, nano-rods, nano-crystals, photonic crystals, ZnO-based materials, III-V compound semiconductors, Si photonics and organic optoelectronic devices.
This book consists of a collection of 74 original peer-reviewed papers. They cover a wide range of topics in the interesting field of nano-structure related semiconductor photonics; a field which encompasses quantum dots, quantum wire, nano-wire, nano-rods, nano-crystals, photonic crystals, ZnO-based materials, III-V compound semiconductors, Si photonics and organic optoelectronic devices.
Edited by:
N. Ohno and T. Uehara
Online since: June 2007
Description: Volume is indexed by Thomson Reuters CPCI-S (WoS).
This edited collection of 240 peer-reviewed articles covers a broad range of topics dealing with plasticity in various materials, such as metals, composites, polymers, foams, soils, and rocks at the nano-, micro- and macro-scales. These informative papers will bring the reader fully up-to-date with the latest research efforts advancing on a broad range of fronts in engineering plasticity
This edited collection of 240 peer-reviewed articles covers a broad range of topics dealing with plasticity in various materials, such as metals, composites, polymers, foams, soils, and rocks at the nano-, micro- and macro-scales. These informative papers will bring the reader fully up-to-date with the latest research efforts advancing on a broad range of fronts in engineering plasticity
Edited by:
Shen Dong and Yingxue Yao
Online since: May 2007
Description: Volume is indexed by Thomson Reuters CPCI-S (WoS).
Precision engineering and micro/nano technologies have been developing rapidly in recent years, and are set to become the dominant players in a new industrial revolution of the 21st century. They will not only provide new possibilities for exponential development of the global economy, but also cause a revolution in human understanding.
Precision engineering and micro/nano technologies have been developing rapidly in recent years, and are set to become the dominant players in a new industrial revolution of the 21st century. They will not only provide new possibilities for exponential development of the global economy, but also cause a revolution in human understanding.
Edited by:
Chunli BAI, Sishen XIE, Xing ZHU
Online since: March 2007
Description: Volume is indexed by Thomson Reuters CPCI-S (WoS).
Nanotechnology has been a priority research field in many countries, because new discoveries in this field have the potential power to unravel new phenomena and new principles of materials use. This collection of knowledge concerning frontier issues in nanotechnology will aid the further promotion of the integration of nanotechnology and industry.
Nanotechnology has been a priority research field in many countries, because new discoveries in this field have the potential power to unravel new phenomena and new principles of materials use. This collection of knowledge concerning frontier issues in nanotechnology will aid the further promotion of the integration of nanotechnology and industry.
Edited by:
Robert P. Devaty, David J. Larkin and Stephen E. Saddow
Online since: October 2006
Description: Volume is indexed by Thomson Reuters CPCI-S (WoS).
Silicon Carbide (SiC), Gallium Nitride (GaN) and Diamond are examples of wide-bandgap semiconductors having chemical, electrical and optical properties which make them very attractive for the fabrication of high-power and high-frequency electronic devices, as well as light-emitters and sensors which have to operate under harsh conditions.
Silicon Carbide (SiC), Gallium Nitride (GaN) and Diamond are examples of wide-bandgap semiconductors having chemical, electrical and optical properties which make them very attractive for the fabrication of high-power and high-frequency electronic devices, as well as light-emitters and sensors which have to operate under harsh conditions.
Edited by:
P. VINCENZINI and G. MARLETTA
Online since: October 2006
Description: This collection presents 31 papers. Altogether, the collection offers a wealth of up-to-date information on Disclosing Materials at the Nanoscale.