Books by Keyword: Diffusion Length

Books

Edited by: Prof. Wilfried Kurz, Dr. David J. Fisher and Prof. Michel Rappaz
Online since: August 2023
Description:

Since the 4th 1998 edition, there have been numerous crucial advances to the modelling and the basic understanding of solidification phenomena, and with its linking to experimental results. These topics have been incorporated into this 5th Fully Revised Edition, as well as a new final chapter on microstructure selection which explains how to combine the concepts of the preceding chapters for modelling real microstructures, in complex processes such as additive manufacturing.

This new 5th edition is of high interest to undergraduate and graduate levels and professionals.
With its numerous new topics - also borne out by the new authorship - students and teachers, scientists and engineers will greatly benefit from this new book. The topics are presented in the same praised manner as in previous editions, readable at three levels:
- an initial feel for the subject is obtained by consulting the figures and their detailed captions;
- a deeper understanding of the underlying physics is found by working through the main text;
- 15 appendices offer a detailed analysis of the various theories, by providing detailed derivations of the relevant equations.
Particularly Novel: the final chapter 8 on microstructure-selection explains how to combine the concepts of the preceding chapters to model the real microstructures formed during complex processes such as additive manufacturing, and the new detailed phase-field appendix which opens the door to the accurate computer-modelling of growth-forms.
This edition goes with a companion Solutions Manual offering model solutions to 133 problems (exercises).

Authors: Prof. Wilfried Kurz, Dr. David J. Fisher and Prof. Michel Rappaz
Online since: August 2023
Description:

Solutions Manual is a companion book to the Fundamentals of Solidification 5th edition offering model solutions to 133 problems (exercises). The 5th edition of Fundamentals of Solidification (2023) includes new contributions on phase-field modelling and a new 8th Chapter on microstructure selection. It explains how to combine the concepts of the seven preceding chapters of the book so as to model the real microstructures that form during complex processes such as additive manufacturing … which are still a challenge or are out of reach of numerical simulation. This Solutions Manual, together with the 5th edition of the main text, will offer its readership a good start in the field, and prepare them for tackling more involved treatments of solidification.

The main book Fundamentals of Solidification 5th fully revised edition is available separately.
Authors: Prof. Wilfried Kurz, Dr. David J. Fisher and Prof. Michel Rappaz
Online since: February 2023
Description:

Since the 4th 1998 edition, there have been numerous crucial advances to the modelling and the basic understanding of solidification phenomena, and with its linking to experimental results. These topics have been incorporated into this 5th Fully Revised Edition, as well as a new final chapter on microstructure selection which explains how to combine the concepts of the preceding chapters for modelling real microstructures, in complex processes such as additive manufacturing.

This new 5th edition is of high interest to undergraduate and graduate levels and professionals. For orders you are welcome to download the Order Form.
With its numerous new topics - also borne out by the new authorship - students and teachers, scientists and engineers will greatly benefit from this new book. The topics are presented in the same praised manner as in previous editions, readable at three levels:
- an initial feel for the subject is obtained by consulting the figures and their detailed captions;
- a deeper understanding of the underlying physics is found by working through the main text;
- 15 appendices offer a detailed analysis of the various theories, by providing detailed derivations of the relevant equations.
Particularly Novel: the final chapter 8 on microstructure-selection explains how to combine the concepts of the preceding chapters to model the real microstructures formed during complex processes such as additive manufacturing, and the new detailed phase-field appendix which opens the door to the accurate computer-modelling of growth-forms.
This book has a companion book Solutions Manual which is available separately.

Edited by: T. Fuyuki, T. Sameshima, H.P. Strunk and J.H. Werner
Online since: June 2003
Description: Volume is indexed by Thomson Reuters CPCI-S (WoS).
This book comprises the over 100 contributions that were presented at the International Conference on Polycrystalline Semiconductors which took place from September 10 to 13, 2002, in Nara, Japan.
Edited by: H. Tomokage and T. Sekiguchi
Online since: April 2001
Description: The characterisation of semiconductors is of key importance in preparing and applying semiconductors in industry.
Volume is indexed by Thomson Reuters CPCI-S (WoS).
The present work deals with theoretical and experimental topics which are related to the assessment of microstructures in semiconductors by means of beam injection and related methods.
Edited by: J.H. Werner, H.P. Strunk, H.W. Schock
Online since: April 1999
Description: Like the previous conferences in this series, POLYSE '98 covered many aspects of polycrystalline semiconductors. Whereas earlier proceedings had included many contributions on basic research, for example on the structural properties of single grain boundaries, later proceedings had included more articles on solar cells and thin-film transistors, seemingly marking a transition to a more technology-oriented conference. However, the contributions to POLYSE '98 show that the POLYSE-series is again bringing together researchers from basic research as well as engineers working on devices.

The 84 papers cover topics such as: beam-induced currents, thin-film silicon, silicon crystallization, oxide semiconductor films, chalcogenide and spinel films, chalcopyrite films, thin-film junctions and devices; thus providing an extensive survey of the most recent results in polycrystalline semiconductor research.
Edited by: M. Kittler, O. Breitenstein, A. Endrös, W. Schröter
Online since: December 1998
Description: The 5th International Workshop on Beam Injection Assessment of Defects in Semiconductors (BIADS 98) focussed on many theoretical and experimental aspects of this topic. The aim was to bring together specialists working in the fields of both fundamental research and applications. There were more than 80 participants from 15 countries all over the world.
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