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HomeMaterials Science ForumMaterials Science Forum Vols. 287-288Crystallography and Microstructure of Thin Films...

Crystallography and Microstructure of Thin Films Studied by X-Ray and Electron Diffraction

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Periodical:

Materials Science Forum (Volumes 287-288)

Pages:

23-60

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.287-288.23

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Online since:

August 1998

Authors:

Robert A. Schwarzer

Keywords:

BKD, Crystal Texture, Electron Backscattered Pattern (EBSP), Grain Boundary, Kikuchi Patterns, Pole Figure, Residual Stress, X-Ray Diffraction (XRD), X-Ray Fluorescence Analysis

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© 1998 Trans Tech Publications Ltd. All Rights Reserved

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