HOME CONTACT

Username: Password:

> @scientific.net

Defects and Diffusion in Semiconductors IV

Defect and Diffusion Forum Volumes 200 - 202

• Papers
• Abstracts

• p1 Thick GaN Films Grown on Sapphire: Defects in Highly Mismatched Systems   [ 1 M ]
  Authors: T. Paskova, E. Valcheva, Bo Monemar
• p29 Novel Defect-Related Properties of Silicon   [ 686 K ]
  Authors: S.M. Prokes, R.C. Cammarata
• p47 The Search for Tunnelling States in Bulk Silicon Disordered by Fast Neutron Irradiation   [ 984 K ]
  Authors: Michèle Coeck, Christiane Laermans
• p67 Residual Shallow Donor- and Acceptor-Impurities in SSD- and LEC-Grown High-Purity InP Crystals   [ 1 M ]
  Authors: E. Kubota, S. Yamada, Kotoji Ando
• p97 Dislocations in Semiconductors: Core Structure and Mobility   [ 489 K ]
  Authors: João F. Justo
• p107 Analysis of Radiation-Induced Defects in InGaP Materials and Solar Cells   [ 930 K ]
  Authors: Aurangzeb Khan
• p125 A Perspective from Crystal Growth and Wafer Processing on the Properties of Intrinsic Point Defects in Silicon   [ 461 K ]
  Authors: Robert Falster, Vladimir V. Voronkov
• p135 Copper Complexes in Silicon Crystals   [ 464 K ]
  Authors: Minoru Nakamura
• p145 The Effect of Implant Temperature and Pre-Annealing on Defect Formation after Laser Thermal Processing   [ 406 K ]
  Authors: H.B. Banisaukas, Kevin S. Jones, S. Talwar, D.C. Jacobson
• p153 X-Ray Topographic Analysis of Misfit Dislocation Distribution in InGaAs and GeSi/Si Partially Relaxed Heterostructures   [ 570 K ]
  Authors: C. Ferrari
• p161 Processing-Induced Defects in Epitaxially Grown p- and n-Type SiGe   [ 579 K ]
  Authors: M. Mamor, F.D. Auret, S.A. Goodman
• p177 Quantitative Measurements of Vacancy Defects in High-Energy Ion-Implanted Si   [ 552 K ]
  Authors: R. Kalyanaraman, T.E. Haynes, V.C. Venezia, D.C. Jacobson, H.J.L. Gossmann, C.S. Rafferty
• p189 Positron Annihilation Studies of Vacancy Defects in Crystalline and Amorphous Si   [ 1 M ]
  Authors: G. Amarendra
• p219 Modelling Cu Diffusion into a Ta Barrier   [ 252 K ]
  Authors: Chun Li Liu
• p225 Transmission Electron Microscopy of the Configuration of Cracks and the Defect Structure near to Cracks in Si   [ 1 M ]
  Authors: Hiroyasu Saka, Suprijadi