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Articles by author: F.G. Kirscht

• Comparison of Nickel and Iron Gettering in Cz Silicon Wafers
  Published in: Gettering anf Defect Engineering in Semiconductor Technology IX (p367)
• Defect Control and Gettering in Cz-Silicon
  Published in: Gettering and Defect Engineering in Semiconductor Technology (p137)
• Effect of Volume Defects on Gold Gettering in CZ-SI
  Published in: Gettering and Defect Engineering in Semiconductor Technology (p41)
• Fine Structure of Dislocation Related PL Bands D1 and D2 in Silicon
  Published in: Gettering and Defect Engineering in Semiconductor Technology XI (p767)
• Gettering Strength Assessment Based on Lifetime Measurements
  Published in: Gettering and Defect Engineering in Semiconductor Technology VIII (p259)
• Impact of Volume Defects on Gold Gettering in Cz-Si Wafers
  Published in: Defects in Semiconductors 15 (p237)
• Iron Solubility in Boron-Doped Silicon and Fe Gettering Mechanism in p/p⁺ Epitaxial Wafers
  Published in: Gettering anf Defect Engineering in Semiconductor Technology IX (p331)
• Laser Scattering Tomography on Magnetic CZ-Si for Semiconductor Process Optimization
  Published in: Gettering and Defect Engineering in Semiconductor Technology XI (p597)
• Strain and Gettering in Epitaxial Silicon Wafers
  Published in: Gettering and Defect Engineering in Semiconductor Technology VII (p355)
• Volume Defect Formation in CZ SI Wafers and Related Electrical Effects
  Published in: Gettering and Defect Engineering in Semiconductor Technology (p103)