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Articles by author: J.R. Morante

• Analysis of the Electric Field Influence on the Emission Rate of the Te-Related Center in GaAs_0.6P_0.4
  Published in: Defects in Semiconductors 14 (p533)
• Charge Storage Effects in Si Nanocrystals Embedded in SiO₂ Thin Films
  Published in: Polycrystalline Semiconductors VI (p243)
• Comparison between AS-Grown and Annealed Quantum Dots Morphology
  Published in: Defects in Semiconductors 19 (p1689)
• Composition Modulation Effects on the Generation of Defects in In_0.54Ga_0.46As Strained Layers
  Published in: Defects in Semiconductors 16 (p1285)
• Cubic Silicon Carbide Films Grown by Reactive Magnetron Sputtering at Relatively Low Temperature
  Published in: Polycrystalline Semiconductors V (p477)
• Defects Analysis in Strained InAlAs and InGaAs Films Grown on (111)B InP Substrates
  Published in: Defects in Semiconductors 19 (p1211)
• Electrical Evaluation of Silicon on Insulator Structures Formed by Oxygen Implantation by Means of Frequency Resolved Photoconductivity Measurements
  Published in: Gettering and Defect Engineering in Semiconductor Technology (p511)
• Epitaxial Growth of β-SiC on Ion-Beam Synthesized β-SiC: Structural Characterization
  Published in: Silicon Carbide and Related Materials - 1999 (p309)
• Influence of Deposit Thickness on the Microstructure and Surface Roughness of Silicon Films Deposited from Silane
  Published in: Polycrystalline Semiconductors V (p125)
• Influence of the Cobalt on the Electroluminescence Spectra of ZnO
  Published in: Defects in Semiconductors 15 (p567)
• Influence of the Surface Layer Defects on the Conduction Mechanism in Semi-Insulating Gallium Arsenide
  Published in: Defects in Semiconductors 15 (p1457)
• Influence of the Technological Parameters on the Mechanical Properties of Thick Epipolysilicon Layers for Micromechanical Sensors
  Published in: Polycrystalline Semiconductors IV (p423)
• Influence of Thermal Treatments on the Crystallisation of LPCVD-Deposited Si Thin Films
  Published in: Polycrystalline Semiconductors VI (p199)
• Mechanical Properties of Thin and Thick Polysilicon Films for Microsystem Applications
  Published in: Polycrystalline Semiconductors VI (p405)
• Microstructural Study of Nanocrystalline Semiconducting SnO₂ Powders for Sensor Application
  Published in: Polycrystalline Semiconductors IV (p441)