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Articles by author: Michel Mermoux

• Analysis of the Reduction Mechanism of Graphite Oxide in Lithium/Polymer Electrolyte Batteries
  Published in: Intercalation Compounds (p676)
• Characterisation of 4H-SiC PiN Diodes by Micro-Raman Scattering and Photoemission
  Published in: Silicon Carbide and Related Materials 2004 (p437)
• Characterization of Homoepitaxial 4H-SiC Layer Grown from Silane/Propane System
  Published in: Silicon Carbide and Related Materials - 2002 (p165)
• Characterization of Thick 2-Inch 4H-SiC Layers Grown by the Continuous Feed-Physical Vapor Transport Method
  Published in: Silicon Carbide and Related Materials 2003 (p91)
• Coupling between the Raman Spectroscopy and Photoemission Microscopy Techniques: Investigation of Defects in Biased 4H-SiC pin Diodes
  Published in: Silicon Carbide and Related Materials 2006 (p909)
• Investigation of Defects in 4H-SiC by Synchrotron Topography, Raman Spectroscopy Imaging and Photoluminescence Spectroscopy Imaging
  Published in: Silicon Carbide and Related Materials - 2002 (p265)
• Investigation of the Electronic Structure of the UD-4 Defect in 4H-SiC by Optical Techniques
  Published in: Silicon Carbide and Related Materials 2005 (p461)
• Micro-Optical Characterization Study of Highly p-Type Doped SiC:Al Wafers
  Published in: Silicon Carbide and Related Materials 2004 (p393)
• Optical Characterization of Full SiC Wafer
  Published in: Silicon Carbide and Related Materials 2003 (p593)
• Oxygen and Water Vapour Oxidation of 15Cr Ferritic Stainless Steels with Different Silicon Contents
  Published in: High Temperature Corrosion and Protection of Materials 6 (p839)
• Processing of Poly-SiC Substrates with Large Grains for Wafer-Bonding
  Published in: Silicon Carbide and Related Materials 2005 (p71)
• Raman Imaging Analysis of SiC Wafers
  Published in: Silicon Carbide and Related Materials - 2002 (p353)
• Raman Imaging Characterization of Structural and Electrical Properties in 4H SiC
  Published in: Silicon Carbide and Related Materials 2003 (p609)
• Study of the Thermal Oxidation of Fe-15 Cr by Combined Raman and Photoelectrochemical Imaging
  Published in: High Temperature Corrosion and Protection of Materials 6 (p681)
• X-ray Diffraction, Micro-Raman and Birefringence Imaging of Silicon Carbide
  Published in: Silicon Carbide and Related Materials 2000 (p283)