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Articles by author: Robert F. Davis

• Dry Etching and Metallization Schemes in a GaN/SiC Heterojunction Device Process
  Published in: Silicon Carbide and Related Materials - 1999 (p1049)
• Growth and Characterization of Thin Films and Patterned Substrates of III-V Nitrides on SiC (0001) Substrates
  Published in: Silicon Carbide, III-Nitrides and Related Materials (p1111)
• Growth of AIN on 6H- and 4H-SiC by Gas-Source Molecular Beam Epitaxy
  Published in: Silicon Carbide, III-Nitrides and Related Materials (p1181)
• Growth of Homoepitaxial Films on 4H-SiC(11-20)and 8° Off-Axis 4H-SiC(0001) Substrates and their Characterization
  Published in: Silicon Carbide and Related Materials 2003 (p221)
• Influence of Annealing Conditions on Dopant Activation of Si⁺ and Mg⁺ Implanted GaN
  Published in: Silicon Carbide and Related Materials - 1999 (p1615)
• Interface Materials for Damage-Tolerant Oxide Composites
  Published in: Ceramic and Metal Matrix Composites (p27)
• Lateral- and Pendeo-Epitaxial Growth and Defect Reduction in GaN Thin Films
  Published in: Silicon Carbide and Related Materials - 1999 (p1471)
• Material Defects and Rugged Electrical Power Switching in Semiconductors
  Published in: Silicon Carbide and Related Materials 2011 (p1077)
• Paramagnetic Defects in SiC Based Materials
  Published in: Defects in Semiconductors 16 (p1201)
• Pendeo-Epitaxy^TM Process for Aluminum Gallium Nitride Thin Films on Silicon Carbide Substrates via Metalorganic Chemical Vapor Deposition
  Published in: Silicon Carbide and Related Materials - 1999 (p1491)
• Photo-Emission Electron Microscopy (PEEM) of Cleaned and Etched 6H-SiC(0001)
  Published in: Silicon Carbide and Related Materials - 1999 (p353)
• Self-Diffusion Mechanisms in Diamond, SiC, Si and Ge
  Published in: Defects in Semiconductors 15 (p713)
• SiC MISFETs with MBE-grown AlN Gate Dielectric
  Published in: Silicon Carbide and Related Materials - 1999 (p1315)
• Strain Relaxation in GaN/AlN Films Grown on Vicinal and On-Axis SiC Substrates
  Published in: Silicon Carbide and Related Materials 2005 (p1513)