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Articles by keyword: «Grown-in Defects»

• Annealing Behavior of a Ligth ScatteringTomography Detected Defect near the Surface of Si Wafers
  Published in: Defects in Semiconductors 18 (p1725)
• Defect Control in Nitrogen Doped Czochralski Silicon Crystals
  Published in: Gettering and Defect Engineering in Semiconductor Technology VIII (p161)
• Defect Engineering in the Development of Advanced Silicon Crystals and Wafers
  Published in: Gettering and Defect Engineering in Semiconductor Technology VIII (p111)
• Defects in AS-Grown Silicon and their Evolution During Heat Treatments
  Published in: Defects in Semiconductors 19 (p341)
• Differential Interference Contrast Microscopy of Defects in As-Grown and Annealed Si Wafers
  Published in: Gettering and Defect Engineering in Semiconductor Technology VII (p387)
• Diffusion Coefficient and Equilibrium Concentration of Point Defects in Silicon Crystals, Estimated via Grown-in Defect Behavior
  Published in: Gettering anf Defect Engineering in Semiconductor Technology IX (p25)
• Formation of Grown-in Defects in CZ-Si Crystals
  Published in: Gettering and Defect Engineering in Semiconductor Technology VII (p449)
• Gold Diffusion as a Tool for Defect Characterization in Si
  Published in: Gettering and Defect Engineering in Semiconductor Technology X (p495)
• Grown-in Defects in High Temperature Annealed Si Wafers
  Published in: Gettering and Defect Engineering in Semiconductor Technology VIII (p73)
• Growth Parameters Determining the Type of Grown-In Defects in Czockralski Silicon Crystals
  Published in: Defects in Semiconductors 18 (p1713)
• Important Nonradiative Grown-In Defects in MBE-Grown Si and SiGe/Si Heterostructures
  Published in: Defects in Semiconductors 18 (p473)
• Intrinsic Point Defects and Grown-in Defects in Silicon
  Published in: Special Defects in Semiconducting Materials (p1)
• Lattice Defects in High Quality As-Grown CZ Silicon, Studied with Ligth Scattering and Preferential Etching Techniques
  Published in: Defects in Semiconductors 18 (p1755)
• Microdefects in Heavily Phosphorus-Doped Czochralski Silicon
  Published in: Gettering and Defect Engineering in Semiconductor Technology XIV (p201)
• Positron Lifetime in Floating-Zone-Grown Silicon Wafer
  Published in: Positron Annihilation - ICPA-11 (p545)