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Articles by keyword: «P-N Junction»

• ‘Switch-Back Epitaxy’ as a Novel Technique for Reducing Stacking Faults in 3C-SiC
  Published in: Silicon Carbide and Related Materials 2005 (p291)
• 4H-SiC MPS Diode Fabrication and Characterization in an Inductively Loaded Half-Bridge Inverter up to 100 kW
  Published in: Silicon Carbide and Related Materials 2001 (p1177)
• A New Type of SiC Gas Sensor with a pn-Junction Structure
  Published in: Silicon Carbide and Related Materials 2001 (p1427)
• Al and Al/C High Dose Implantation in 4H-SiC
  Published in: Silicon Carbide and Related Materials - 1999 (p885)
• Analytical Modeling of the Gold Diffusion Induced Modification of the Forward Current through P-N Silicon Junctions
  Published in: Gettering and Defect Engineering in Semiconductor Technology VII (p525)
• Charge Build-Up in Solar Cells
  Published in: Polycrystalline Semiconductors III (p465)
• CO₂ Laser Induced Hot Carrier Photoeffect in HgCdTe
  Published in: Ultrafast Phenomena in Semiconductors 2001 (p147)
• Comparison of 4H-SiC pn, Pinch and Schottky Diodes for the 3 kV Range
  Published in: Silicon Carbide and Related Materials 2001 (p1125)
• Current Steps in Poly(3-Hexylthiophene)/ZnO Nanobelt Hybrid Diodes
  Published in: PRICM7 (p1158)
• Demonstration of a 4H SiC Betavoltaic Cell
  Published in: Silicon Carbide and Related Materials 2005 (p1351)
• Diffusion and Electroluminescence Studies of Low Temperature Diffusion of Boron in 3C-SiC
  Published in: Silicon Carbide and Related Materials 2007 (p457)
• Electrical Behaviour of Crystal Defects in Silicon Solar Cells
  Published in: Beam Injection Assessment of Microstructures in Semiconductors (p39)
• Electrical Characteristics of 4H-SiC pn Diode Grown by LPE Method
  Published in: Silicon Carbide and Related Materials 2001 (p1313)
• Electrical Impact of SiC Structural Crystal Defects on High Electric Field Devices
  Published in: Silicon Carbide and Related Materials - 1999 (p1161)
• Extraction of Defect in Doping Silicon Wafer by Analyzing the Lifetime Profile Method
  Published in: Smart Materials (p765)