HOME CONTACT My eBook

Username: Password:

> @scientific.net

Articles by keyword: «Surface Photo Voltage (SPV)»

• Analyzing Oxygen Precipitation Using the Surface Photovoltage Technique (SPV)
  Published in: Gettering and Defect Engineering in Semiconductor Technology VII (p149)
• Cobalt Contamination in Silicon
  Published in: Gettering and Defect Engineering in Semiconductor Technology XI (p571)
• Cu Determination in Silicon Wafers: A Comparison between Electrical and Chemical Measurements
  Published in: Gettering and Defect Engineering in Semiconductor Technology VIII (p461)
• Gettering of Unintentionally Contaminated Silicon Wafers by Phosphorous Ion Implantation and Annealing
  Published in: Gettering and Defect Engineering in Semiconductor Technology VIII (p291)
• Influence of Cobalt Contamination in the Measurement of Diffusion Length of Silicon Wafers
  Published in: Gettering and Defect Engineering in Semiconductor Technology X (p373)
• Interface State Densities and Surface Charge on Wet-Chemically Prepared Si(100) Surfaces
  Published in: Ultra Clean Processing of Silicon Surfaces VII (p23)
• Measurement of Copper in p-Type Silicon Using Charge-Carrier Lifetime Methods
  Published in: Gettering and Defect Engineering in Semiconductor Technology XI (p643)
• Molybdenum Contamination in Silicon: Detection and Impact on Device Performances
  Published in: Ultra Clean Processing of Semiconductor Surfaces IX (p123)
• Surface Texturization and Interface Passivation of Mono-Crystalline Silicon Substrates by Wet Chemical Treatments
  Published in: Ultra Clean Processing of Semiconductor Surfaces IX (p223)