Analysis of Dispersion Characteristic of Microstrip Lines on Ferrite and Silicon Structures with Spectral-Domain Method

Hong Yang; Zhe Yu Chen; Kun Yi Lv

doi:10.4028/www.scientific.net/AMM.130-134.1244

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HomeApplied Mechanics and MaterialsApplied Mechanics and Materials Vols. 130-134Analysis of Dispersion Characteristic of...

Analysis of Dispersion Characteristic of Microstrip Lines on Ferrite and Silicon Structures with Spectral-Domain Method

Abstract:

In this paper, we presented two types of ferrite&si double layer substrate microstrip lines structures and derived waveguide admittance through coordinate rotation and Fourier transformation of Maxwell equations, then we analyzed its characteristics. We performed dispersion characteristic calculations on microstrip lines, discussed influence of various parameters of microstrip lines on dispersion characteristics and compared their characteristics, then we discovered parameters influence on one specific type of structure dispersion is minimum, especially on technique dimension of dielectric. It can make applications for IC fabrication.

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Periodical:

Applied Mechanics and Materials (Volumes 130-134)

Pages:

1244-1249

DOI:

https://doi.org/10.4028/www.scientific.net/AMM.130-134.1244

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Online since:

October 2011

Authors:

Hong Yang, Zhe Yu Chen, Kun Yi Lv

Keywords:

Dispersion, Ferrite, Microstrip, SDA

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References

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