BISS: A Built-In SEU Sensor for Soft Error Mitigation

Abstract:

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This paper presents a built-in SEU sensor (BISS) to detect soft errors in CMOS digital systems. BISS detects SEU-induced soft errors by monitoring the meta-stability in the flip-flops. BISS includes positive pulse generator, footed dynamic inverter and keeper. SPICE simulations validate the approach. Experiments show minor overhead in terms of area. BISS can yield 80% error coverage at the cost of 22% area overhead. As its prominent advantage, insertion of BISS will incur minimal performance degradation.

Info:

Periodical:

Edited by:

Han Zhao

Pages:

4228-4231

DOI:

10.4028/www.scientific.net/AMM.130-134.4228

Citation:

Z. F. Huang and M. X. Yi, "BISS: A Built-In SEU Sensor for Soft Error Mitigation", Applied Mechanics and Materials, Vols. 130-134, pp. 4228-4231, 2012

Online since:

October 2011

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Price:

$35.00

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