BISS: A Built-In SEU Sensor for Soft Error Mitigation

Abstract:

This paper presents a built-in SEU sensor (BISS) to detect soft errors in CMOS digital systems. BISS detects SEU-induced soft errors by monitoring the meta-stability in the flip-flops. BISS includes positive pulse generator, footed dynamic inverter and keeper. SPICE simulations validate the approach. Experiments show minor overhead in terms of area. BISS can yield 80% error coverage at the cost of 22% area overhead. As its prominent advantage, insertion of BISS will incur minimal performance degradation.

• Periodical: Applied Mechanics and Materials (Volumes 130-134)
• Pages: 4228-4231
• DOI: https://doi.org/10.4028/www.scientific.net/AMM.130-134.4228
• Online since: October 2011
• Authors: Zheng Feng Huang, Mao Xiang Yi
• Keywords: Built-in SEU Sensor, Meta-Stability, Single Event Upset, Soft Errors

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