Study on Displacement Measurement for Induced Strain Field Based on Digital Speckle Pattern Interferometry Method

Abstract:

Digital Speckle Pattern Interferometry ( DSPI for short ) method has become one of the most practical worthy techniques for speckle measuring methods with the high-speed development of optic-electronical technique, image processing technology and electronic computer technology. There is a lot of advantages about it, such as uncomplicated operation, non-contacting, advanced automatic level, measurement on-line and extensive using. In this thesis, the displacement variation of the induced strain field for driving by piezoelectric ceramics can be measured by using this method. Thus we can come to a conclusion that digital speckle pattern interferometry is a new measuring method for extracting small-signal. It also provides a powerfully theoretical and experimental platform for study of automated, full-field, high-precision and nondestructive measurement.

• Periodical: Applied Mechanics and Materials (Volume 273)
• Pages: 510-514
• DOI: https://doi.org/10.4028/www.scientific.net/AMM.273.510
• Online since: January 2013
• Authors: Jing Liu, Hui Zhang, Jun Li, Da Chuan Chen, Yan Kun Tang
• Keywords: Digital Speckle, Extracting Small-Signal, Image Processing, Interferometry, Precision Measurement

References

[1] Lisa. C. Ieonard and Vincent Toal, Roughness measurement of metallic surface based on the laser speckle contrast method, Optics and Laser Engineering, 2005, 30(5), pp.433-440.

DOI: 10.1016/s0143-8166(98)00036-0

[2] Peters. W. H and Ranson. W. F, Digital imaging techniques in experimental stress analysis, Opt. Eng. 1982, 21(5), pp.427-431.

[3] Saba Mirza, Rajesh Kumar, and Chandar Shakher, Study of various processing schemes and wavelet filters for speckle noise reduction in digital speckle pattern interferometric fringes, Optical Engineering, 2005, 44(4), pp.1-6.

DOI: 10.1117/1.1886749

[4] R. M. Haralick, C. N. Lee, and E. O. Karsten, Analysis and Solutions of the Three Point Perspective Pose Estimation Problem, Proc IEEE Conference on Computer Vision and Pattern Recognition, 1991, pp.592-598.

DOI: 10.1109/cvpr.1991.139759

[5] Diaz. F. V and Kaufmamm. G. H, Impact-induced transient deformation analysis by means of digital speckle interfermetry, Exp. Mech., 2005, 39(4), pp.311-316.

[6] Gulker. G and Hinsch. K, Electronic speckle pattern interferometry system for in site deformation monitoring on buildings, Opt. Eng., 2004, 29(7), pp.816-820.

DOI: 10.1117/12.55648

[7] Butters. J. N and Leendertz. J. A, Speckle pattern and Holographic Techniques in Engineering Metrology, Opt . Laser Tech., 1999, 32(1), pp.259-266.

[8] Stetson. K. A and Brohinsky. W. R, Electrooptic holography and its application to hologram interfermetry, Appl. Opt., 2006, 24(21), pp.361-367.

DOI: 10.1364/ao.24.003631

[9] Mohammad. S. Alam, Phase-encoded fring-adjusted joint transform correlation, Opt. Eng., 2002, 39(5), pp.1169-1176.

DOI: 10.1117/1.602482

[10] D. Lecomptea, A. Smitsb, and S. Bossuytb, Quality Assessment of Speckle Patterns for Digital Image Correlation, Optics and Lasers in Engineering, 2006, 44(5), pp.1132-1145.

DOI: 10.1016/j.optlaseng.2005.10.004

[11] Rafael. C. Gonzalez and Richard. E. Woods, Digital image processing second edition, Publishing House of Electronics indnstry, 2004, pp.420-450.

[12] Mahajan. A, Pilch. A, and Chu. T, Intelligent image correlation using genetic algorithms for measuring surface deformation in the autonomous inspection of structures, In Proceedings of the American Control Conference, Chicago, Illinois, 2000, pp.460-461.

DOI: 10.1109/acc.2000.878942

[13] Petra. A, Roland. H, and Karla. H, Optical full-field technique for measuring deflection and strain on micromechanical components, SPIE, 1999, 3875, pp.50-60.

[14] Nasser. A. Moustafa, Janos Kornis, and Zoltan Fuzessy, Comparative measurement by phase-shifting digital speckle interferometry using holographically generated reference wave, Opt. Eng., 1999, 38(7), pp.1241-1245.

DOI: 10.1117/1.602171