Accurate SER Estimation by Transform Matrix Analysis for Fault Tolerant Circuits Design

Abstract:

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As the transistor sizes continue to shrink, quantum effects will significantly affect the circuit behavior. The inherent unreliability of nano-electronics will have significantly impact on the way of circuits design, so defects and faults of nano-scale circuit technologies have to be taken into account early in the design of digital systems. Fault-tolerant architectures may become a necessity to ensure that the underlying circuit could function properly. In CAD software, a same logic can be made out with different circuits but different design methodology can reach different soft error tolerance ability, so we must find a way to estimate the error rate of the circuit efficiently to make the design more fault tolerant. In this paper, a new way to fault tolerance design in nano-scale circuit by accurate soft error rate (SER) estimation is proposed. Transform matrix is used for SER computation and a design criteria is then proposed. Simulation results show that the proposed transform matrix model is effective for nano-scale circuits and the criteria delivered is suitable CAD tools development in nano-system design.

Info:

Periodical:

Advanced Materials Research (Volumes 121-122)

Edited by:

Donald C. Wunsch II, Honghua Tan, Dehuai Zeng, Qi Luo

Pages:

87-92

DOI:

10.4028/www.scientific.net/AMR.121-122.87

Citation:

C. H. Yu "Accurate SER Estimation by Transform Matrix Analysis for Fault Tolerant Circuits Design", Advanced Materials Research, Vols. 121-122, pp. 87-92, 2010

Online since:

June 2010

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Price:

$35.00

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