The Blue Luminescence of CeCl3 Doped Aluminum Oxide Thin Film
Aluminum oxide film doped with Ce3+ has been deposited by the medium frequency reactive magnetron sputtering technique. The photoluminescence emission from these films show peaks at range of 374-405 nm. The relative intensity of these peaks is strongly dependent on the amount of Ce incorporated in the films. The presence of Ce3+ as well as the stoichiometry of these films has been determined by energy dispersive x-ray spectroscope (EDS) measurements. It is proposed that the light emission observed generated by luminescent center associated with cerium chloride molecular rather than to atomic cerium impurities. The reason for a dominance of the lower energy transition as the amount of Ce3+ in the oxide films is increased is that the energy difference of 4f1and 5d1 decreases, with the increase of the Ce3+ concentration. These luminescent films are potentially good candidates for photonics applications.
Jianzhong Wang and Jingang Qi
G. J. Liao et al., "The Blue Luminescence of CeCl3 Doped Aluminum Oxide Thin Film", Advanced Materials Research, Vols. 299-300, pp. 456-459, 2011