The Blue Luminescence of CeCl3 Doped Aluminum Oxide Thin Film

Abstract:

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Aluminum oxide film doped with Ce3+ has been deposited by the medium frequency reactive magnetron sputtering technique. The photoluminescence emission from these films show peaks at range of 374-405 nm. The relative intensity of these peaks is strongly dependent on the amount of Ce incorporated in the films. The presence of Ce3+ as well as the stoichiometry of these films has been determined by energy dispersive x-ray spectroscope (EDS) measurements. It is proposed that the light emission observed generated by luminescent center associated with cerium chloride molecular rather than to atomic cerium impurities. The reason for a dominance of the lower energy transition as the amount of Ce3+ in the oxide films is increased is that the energy difference of 4f1and 5d1 decreases, with the increase of the Ce3+ concentration. These luminescent films are potentially good candidates for photonics applications.

Info:

Periodical:

Advanced Materials Research (Volumes 299-300)

Edited by:

Jianzhong Wang and Jingang Qi

Pages:

456-459

DOI:

10.4028/www.scientific.net/AMR.299-300.456

Citation:

G. J. Liao et al., "The Blue Luminescence of CeCl3 Doped Aluminum Oxide Thin Film", Advanced Materials Research, Vols. 299-300, pp. 456-459, 2011

Online since:

July 2011

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$35.00

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