The Blue Luminescence of CeCl₃ Doped Aluminum Oxide Thin Film

Abstract:

Aluminum oxide film doped with Ce³⁺ has been deposited by the medium frequency reactive magnetron sputtering technique. The photoluminescence emission from these films show peaks at range of 374-405 nm. The relative intensity of these peaks is strongly dependent on the amount of Ce incorporated in the films. The presence of Ce³⁺ as well as the stoichiometry of these films has been determined by energy dispersive x-ray spectroscope (EDS) measurements. It is proposed that the light emission observed generated by luminescent center associated with cerium chloride molecular rather than to atomic cerium impurities. The reason for a dominance of the lower energy transition as the amount of Ce³⁺ in the oxide films is increased is that the energy difference of 4f¹and 5d¹ decreases, with the increase of the Ce³⁺ concentration. These luminescent films are potentially good candidates for photonics applications.

• Periodical: Advanced Materials Research (Volumes 299-300)
• Pages: 456-459
• DOI: https://doi.org/10.4028/www.scientific.net/AMR.299-300.456
• Online since: July 2011
• Authors: Guo Jin Liao, Hong Luo, Shao Feng Yan, Ming Chen
• Keywords: Aluminium Oxide, Blue Photoluminescence, Rare Earth (RE), Sputtering, Thin Film

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