Study on Nano-SiO2 Measured by Atomic Force Microscope

Zhang Jing; Qi Zhi Cao; Jian Ying Li

doi:10.4028/www.scientific.net/AMR.399-401.2130

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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 399-401Study on Nano-SiO2 Measured by Atomic Force...

Study on Nano-SiO₂ Measured by Atomic Force Microscope

Abstract:

The morphology and structural evolution of nano-SiO₂ powers obtained by pressuring samples and sintering in muffle at different temperatures were studied by X-ray diffraction (XRD) and atomic force microscope (AFM). The experimental results show that the particle sizes of nano-SiO₂ increase with temperature rising, and it meets the physical mechanism of particle growth.

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Periodical:

Advanced Materials Research (Volumes 399-401)

Pages:

2130-2133

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.399-401.2130

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Online since:

November 2011

Authors:

Zhang Jing, Qi Zhi Cao, Jian Ying Li

Keywords:

Atomic Force Microscope (AFM), Nano-SiO₂, Particle Size

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References

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