Research on Noise Simulation of Infrared Detector

Shu Li Lou; Yan Li Han; Jian Cun Ren; Xiao Hu Yuan; Xiao Dong Zhou

doi:10.4028/www.scientific.net/AMR.433-440.4120

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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 433-440Research on Noise Simulation of Infrared Detector

Research on Noise Simulation of Infrared Detector

Abstract:

Noises of infrared detector have an important influence on sensitivity of infrared imaging system, and it affect the imaging quality and performance of infrared system. Research on noises of infrared detector is a challenging topic in designing, simulating and evaluating of infrared imaging system. All kinds of noises are studied in detail, and mathematical models are built. The method of simulating noises of detector is proposed, and noises are simulated based on the mathematical model.

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Periodical:

Advanced Materials Research (Volumes 433-440)

Pages:

4120-4123

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.433-440.4120

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Online since:

January 2012

Authors:

Shu Li Lou, Yan Li Han, Jian Cun Ren, Xiao Hu Yuan, Xiao Dong Zhou

Keywords:

Infrared Detector, Noise, Simulation

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References

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