Study on the Application of Multi-Frequency Error Test

Xiao Jun He; Xiao Ping Tian; Bo Dai

doi:10.4028/www.scientific.net/AMR.433-440.4802

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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 433-440Study on the Application of Multi-Frequency Error...

Study on the Application of Multi-Frequency Error Test

Abstract:

In order to test the characteristics of the telephone line, BER (Bit Error Rate) test is one of the most important aspects. The multi-frequency BER test is achieved using FPGA (Field Programmable Gate Array), MCU (Micro Controller Unit) and Modem chip. This design is able to exactly test the telephone line’s bit error whose frequency is between 1.2KHz and 160KHz. repeatedly experiments results show that this method is stable and reliable, and has important application values.

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Periodical:

Advanced Materials Research (Volumes 433-440)

Pages:

4802-4806

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.433-440.4802

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Online since:

January 2012

Authors:

Xiao Jun He, Xiao Ping Tian, Bo Dai

Keywords:

BER Test, Modem Chip, M-Sequences, Telephone Line

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