[1]
S. Lai: Tech. Dig. IEDM, 2003, p.255.
Google Scholar
[2]
Y. Yin, A. Miyachi, D. Niida, H. Sone and S. Hosaka: Jpn. J. Appl. Phys. Vol. 45, (2006), p. L726.
Google Scholar
[3]
S.R. Ovshinsky and H. Fritzsche: IEEE. Trans. Electron. Dev. Vol. 20, (1973), p.91.
Google Scholar
[4]
P. Zhou, Y. C. Shin, B. J. Choi, S. Choi, C. S. Hwang, Y. Y. Lin, H. B. Lv, X. J. Yan, T. A. Tang, L. Y. Chen and B. M. Chen, Electrochemical and Solid-State Letters Vol. 10 (2007), p. H281.
Google Scholar
[5]
P. Zhou, M. Yin, H. J. Wan, H. B. Lu, T. A. Tang and Y. Y. Lin: Appl. Phys. Lett. Vol. 94 (2009), p.053510.
Google Scholar
[6]
K. Terabe, T. Hasegawa, T. Nakayama and M. Aono: Nature 433 (2005), p.47.
Google Scholar
[7]
Y. Yin, T. Noguchi, H. Ohno and S. Hosaka: Appl. Phys. Lett. Vol. 95 (2009), p.133503.
Google Scholar
[8]
G. Bruns, P. Merkelbach, C. Schlockermann, M. Salinga, M. Wuttig, T. D. Happ, J. B. Philipp and M. Kund: Appl. Phys. Lett. Vol. 95 (2009), p.043108.
DOI: 10.1063/1.3191670
Google Scholar
[9]
Y. Yin and S. Hosaka: Microelectron. Eng., Vol. 88 (2011), p.2794.
Google Scholar
[10]
F. Rao, Z. Song, M. Zhong, L. Wu, G. Feng, B. Liu, S. Feng and B. Chen: Jpn. J. Appl. Phys. Vol. 46, (2007), p. L25.
Google Scholar
[11]
Y. Yin, H. Sone and S. Hosaka: Jpn. J. Appl. Phys. Vol. 44 (2005), p.6208.
Google Scholar
[12]
I. Friedrish, V. Weidenhof, W. Njoroge, P. Franz and M. Wuttig: J. Appl. Phys. Vol. 87 (2000), p.4130.
Google Scholar
[13]
K. Nakayama, K. Kojima, F. Hayakawa, Y. Imai, A. Kitagawa and M. Suzuki: Jpn. J. Appl. Phys. Vol. 39 (2000), p.6157.
Google Scholar
[14]
Y. Yin, D. Niida, K. Ota, H. Sone and S. Hosaka: Rev. Sci. Instrum. Vol. 78 (2007), p.126101.
Google Scholar
[15]
D. H. Kang, D. H. Ahn, K. B. Kim, J. F. Webb and K. W. Yi: J. Appl. Phys. Vol. 94 (2003), p.3536.
Google Scholar
[16]
Y. Yin, H. Sone and S. Hosaka: Jpn. J. Appl. Phys. Vol. 45 (2006), p.6177.
Google Scholar
[17]
F. Rao, Z. Song, M. Zhong, L. Wu, G. Feng, B. Liu, S. Feng and B. Chen: Jpn. J. Appl. Phys. Vol. 46 (2007), p. L25.
Google Scholar
[18]
Y. Yin, T. Noguchi and S. Hosaka: Jpn. J. Appl. Phys. Vol. 50 (2011), p.105201.
Google Scholar
[19]
Y. C. Chen, C. T. Rettner, S. Raoux, G. W. Burr, S. H. Chen, R. M. Shelby, M. Salinga, et al. : Tech. Dig. IEDM, 2006, p.777.
Google Scholar
[20]
Y. Zhang, J. Feng, Y. Zhang, Z. Zhang, Y. Lin, T. Tang, B. Cai and B. Chen: Phys. Status Solidi: Rapid Res. Lett. Vol. 1 (2007), p. R28.
Google Scholar