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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 55-57High Resolution X-Ray Diffraction and Raman...

High Resolution X-Ray Diffraction and Raman Scattering Studies of Cubic-Phase InN Films Grown by MBE

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Periodical:

Advanced Materials Research (Volumes 55-57)

Pages:

773-776

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.55-57.773

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Online since:

August 2008

Authors:

S. Kuntharin, S. Sanorpim, Hiroyuki Yaguchi, Y. Iwahashi, M. Orihara, Y. Hijakata, Sadafumi Yoshida

Keywords:

c-InN, High Resolution X-Ray Diffraction (HR-XRD), h-InN, MBE, Raman Scattering

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© 2008 Trans Tech Publications Ltd. All Rights Reserved

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