High Resolution X-Ray Diffraction and Raman Scattering Studies of Cubic-Phase InN Films Grown by MBE

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Periodical:

Advanced Materials Research (Volumes 55-57)

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Edited by:

Tawee Tunkasiri

Pages:

773-776

DOI:

10.4028/www.scientific.net/AMR.55-57.773

Citation:

S. Kuntharin et al., "High Resolution X-Ray Diffraction and Raman Scattering Studies of Cubic-Phase InN Films Grown by MBE", Advanced Materials Research, Vols. 55-57, pp. 773-776, 2008

Online since:

August 2008

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$35.00

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