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Microstructural and Magnetic Properties of C/FePt/Ti Films by Facing Sputtering
Abstract:
C/FePt/Ti nano-thin films were prepared by DC facing-target magnetron sputtering system onto glass substrates at room temperature and subsequently in situ annealed for 500 °C 30 min in vacuum. The influence of C capping layer on microstructural and magnetic properties of the FePt films were investigated in detail. Atomic force microscopy (AFM) images indicate that C can effectively isolate the particles, refine particle, and distribute; however, the particle size distribution is uneven for too much C. The easy magnetic axial orientation is changed with the C layer thickness.
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1787-1790
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Online since:
July 2012
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© 2012 Trans Tech Publications Ltd. All Rights Reserved
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