Fabrication of Silver Nanoparticle Decorated AFM Tips for Tip-Enhanced Raman Scattering Applications

Abstract:

We report on a simple method for the fabrication of metalized tips by depositing gas-phase synthesized silver nanoparticles onto atomic force microscope (AFM) tips. The method enables fabricating tips suitable for AFM based tip-enhanced Raman spectroscopy (TERS) with high yield. The performance of the fabricated silver nanoparticle decorated tips is examined by detecting low concentration BPE molecules using a transmission mode TERS setup. An 30-fold enhancement of the Raman signal is shown. The net TERS enhancement factor is calculated to be about 1000.

• Periodical: Advanced Materials Research (Volume 643)
• Pages: 195-198
• DOI: https://doi.org/10.4028/www.scientific.net/AMR.643.195
• Online since: January 2013
• Authors: Yu Hua Li, Chang Hui Xu, Min Han
• Keywords: Cluster Beam Deposition, Low Level Molecule Detection, Silver Nanoparticle, Tip-Enhanced Raman Scattering

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