Two-Photon Selective Reflection Spectroscopy of Confined Atomic Vapor at the Interface with a Ferroelectric Layer

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We examine two-photon selective reflection (SR) spectroscopy in a system of -type three-level atoms at the interface with a ferroelectric layer on a dielectric surface. Two-photon SR lines, exhibiting Dicke-narrowing profiles due to atom-wall collision and Doppler free configuration, are periodically modulated by the thickness of the atomic vapor. These SR lines can be modified by the thickness and the complex refractive index of the ferroelectric layer, and can probably be a feasible method used in the measurement of the optical parameters of the ferroelectric layer.

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226-232

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March 2013

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© 2013 Trans Tech Publications Ltd. All Rights Reserved

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