A Study for Embedded Software Double-Fault Testability

Li Na Zhang; Yong Mei Liu; Yi Ning Sun

doi:10.4028/www.scientific.net/AMR.748.843

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HomeAdvanced Materials ResearchAdvanced Materials Research Vol. 748A Study for Embedded Software Double-Fault...

A Study for Embedded Software Double-Fault Testability

Abstract:

The testability is one of the important features to the quality of software, which can guide the intensity and degree of the test, arrange test progress better. Any embedded software can not only contain just a fault, there may be two or more faults, and there is correlation among these faults. In order to arrange testing resources more reasonably, this paper uses correlation matrix to put forward the Embedded Software Testability Fault Model, ESDFM, which based on fault/failure model, and introduces the process of the measurement.

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Periodical:

Advanced Materials Research (Volume 748)

Pages:

843-846

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.748.843

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Online since:

August 2013

Authors:

Li Na Zhang, Yong Mei Liu, Yi Ning Sun

Keywords:

Embedded Software Testing, ESDFM, Testability

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References

[1] Mohd Nazir, Dr. Raees A. Khan. Dr.K. Mustafa. Testability Estimation Framework[J]. International Journal of Computer Applications, 2010, 2(5): 9-14.

Google Scholar

[2] Jeffrey M. Voas. PIE: A Dynamic Failure-based Tecgique[J]. IEEE Transcations on Software Engineering, 1992, 18(8): 717-727.

DOI: 10.1109/32.153381

Google Scholar

[3] Voas J, Miller K, Payne J. Designing program that are less likely to hide fault[J]. Journal of Systems and Software( Elsevier Science), 1993, 20(1): 93-100.

DOI: 10.1016/0164-1212(93)90051-x

Google Scholar

[4] Jeffrey M. Voas , Kelth W. Miller, Software Testability: The New Verification. IEEE Software[J] , 1995, 12(3).

DOI: 10.1109/52.382180

Google Scholar

[5] Tsung-Han Tsai, Chin-Yu Huang, Jun-Ru Chang. A study of applying extended pie technique to software testability analysis[C]. International Computer Software and Applications Conference, 2009: 89-98.

DOI: 10.1109/compsac.2009.22

Google Scholar