Characterization of Zn0.96Al0.02Ga0.02O Thermoelectric Material

Panida Pilasuta; Pennapa Muthitamongkol; Chanchana Thanachayanont; Tosawat Seetawan

doi:10.4028/www.scientific.net/AMR.802.227

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HomeAdvanced Materials ResearchAdvanced Materials Research Vol. 802Characterization of Zn0.96Al0.02Ga0.02O...

Characterization of Zn_0.96Al_0.02Ga_0.02O Thermoelectric Material

Abstract:

Crystal structure of Zn_0.96Al_0.02Ga_0.02O was analyzed by X-Ray diffraction (XRD) technique and the microstructure was observed by scanning electron microscopy (SEM), and transmission electron microscopy (TEM). The XRD results showed single phase and hexagonal structure a = b = 3.24982 Å, and c = 5.20661 Å. The SEM and TEM results showed the grain size of material arrangement changed after sintering and TEM diffraction pattern confirmed hexagonal crystal structure of Zn_0.96Al_0.02Ga_0.02O after sintering.

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Periodical:

Advanced Materials Research (Volume 802)

Pages:

227-231

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.802.227

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Online since:

September 2013

Authors:

Panida Pilasuta, Pennapa Muthitamongkol, Chanchana Thanachayanont, Tosawat Seetawan

Keywords:

Characterization, Thermoelectric Material, Zinc Aluminumgallium Oxide

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