A Method for Analog Integrated Circuit Embedded Self-Test

Abstract:

Aimed at the embedded analog integrated circuit chip, a research for the analog integrated circuit self-test is presented in this paper. As an embedded test system, one of the key factors is to minimize the resources occupation rate besides completing the test task. The principle of this study is to simplify the scale of the test circuit, in order to reduce the hardware cost of the analog integrated circuit performance test as much as possible. The idea is like this: sending the impulse signal as the excitation to the under test circuit and transforming its response signals into digital. Thus, it is convenient to test and analyses the circuit by digital means and make full use of the pulse-testing technology. Based on the above ideas, we design a structure of the analog integrated circuit self-test, and do some tests. The experiment results prove the correctness and feasibility of our design.

• Periodical: Advanced Materials Research (Volumes 816-817)
• Pages: 1069-1072
• DOI: https://doi.org/10.4028/www.scientific.net/AMR.816-817.1069
• Online since: September 2013
• Authors: Chang Jiang Feng, Bing Xue, Ze Jian Zhang
• Keywords: Analog Integrated Circuit, Frequency Response, Impulse Width, Self-Testing

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