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Electrical Characterization and Microstructures of Bi4-xTmxTi3O12 Ceramics
Abstract:
Tm-doped bismuth titanate (Bi4-xTmxTi3O12: BTT) and pure Bi4Ti3O12 (BIT) ceramics with random orientation were fabricated by a conventional electroceramic technique. These samples had polycrystalline Bi-layered perovskite structure without preferred orientation, and consisted of well developed plate-like grains with random orientation. Tm-doping into BIT caused a large shift of the Curie temperature ( TC ) from 675 °C to lower temperature and a improvement in dielectric property. The experimental results indicated that Tm doping into BIT also result in a remarkable improvement in ferroelectric property. The Pr and the Ec values of the BTT ceramic with x=0.75 were 16 μC/cm2 and 75 kV/cm, respectively.
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17-20
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November 2013
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© 2014 Trans Tech Publications Ltd. All Rights Reserved
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