Immunity Test of a Microcontroller by Using Transmission Line Pulse Generator

Abstract:

Electrostatic discharge is a familiar interfere. Repeatability of discharge current is poor. Transmission line pulse (TLP) is used in study of immunity of a microcontroller. A TLP generator is first manufactured with the rise time of output pulse less than 1ns. Then couplings by electric field probe, magnetic field probe and direct injection are presented. And immunity test of a microcontroller is done by using the TLP generator and probes. Results show that the tested microcontroller is more sensitive to magnetic field interference; reset pin and crystal oscillator pin of the chip are more sensitive than other pins under action of direct injection interference.

• Periodical: Advanced Materials Research (Volumes 860-863)
• Pages: 2296-2299
• DOI: https://doi.org/10.4028/www.scientific.net/AMR.860-863.2296
• Online since: December 2013
• Authors: Zhen Guang Liang*, Ming Yuan Yang
• Keywords: Coupling, Electrostatic Discharge, Immunity, Microcontroller, Transmission Line Pulse

References

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