Matrix Method for X-Ray Stress Measurement in Single Crystals, and the Rational Planning of the Measurements

Balder Ortner

doi:10.4028/www.scientific.net/AMR.996.58

Paper Titles

Relationship between Dislocation Density and Macro Strain of High-Heat-Load Materials
p.33

X-Ray Line Profile Study on Shot/Laser-Peened Stainless Steel
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Local Stress Analysis in an SMA during Stress-Induced Martensitic Transformation by Kossel Microdiffraction
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A Profile-Based Method of Determining Intragranular Strains Using Kossel Diffraction Patterns
p.52

Matrix Method for X-Ray Stress Measurement in Single Crystals, and the Rational Planning of the Measurements
p.58

Measurement of Complementary Strain Fields at the Grain Scale
p.64

Impact of Shot-Peening on a Single Crystal Nickel-Based Superalloy
p.70

Evaluation of Welding Residual Stresses Using Diffraction Spot Trace Method
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Accounting for a Distribution of Morphologies and Orientations on Stresses Analysis by X-Ray and Neutron Diffraction: Normalized Self-Consistent Modeling
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HomeAdvanced Materials ResearchAdvanced Materials Research Vol. 996Matrix Method for X-Ray Stress Measurement in...

Matrix Method for X-Ray Stress Measurement in Single Crystals, and the Rational Planning of the Measurements

Abstract:

With the so-called matrix method stress calculation from x-ray diffraction measurements is much easier than it used to be with older methods. The matrix method is also well suited to optimize the choice of reflections (hkl) to be measured in order to obtain the best results with least experimental effort. Pseudocodes for the stress calculation are given.

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Periodical:

Advanced Materials Research (Volume 996)

Pages:

58-63

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.996.58

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Online since:

August 2014

Authors:

Balder Ortner*

Keywords:

Matrix Method, Single Crystal, X-Ray Stress Measurement

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Creative Commons CC BY 4.0

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* - Corresponding Author

References

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