Impact of Shot-Peening on a Single Crystal Nickel-Based Superalloy

Amélie Morancais; Mathieu Fevre; Manuel François; Pascale Kanoute; Serge Kruch; Arnaud Longuet

doi:10.4028/www.scientific.net/AMR.996.70

Paper Titles

Local Stress Analysis in an SMA during Stress-Induced Martensitic Transformation by Kossel Microdiffraction
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A Profile-Based Method of Determining Intragranular Strains Using Kossel Diffraction Patterns
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Matrix Method for X-Ray Stress Measurement in Single Crystals, and the Rational Planning of the Measurements
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Measurement of Complementary Strain Fields at the Grain Scale
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Impact of Shot-Peening on a Single Crystal Nickel-Based Superalloy
p.70

Evaluation of Welding Residual Stresses Using Diffraction Spot Trace Method
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Accounting for a Distribution of Morphologies and Orientations on Stresses Analysis by X-Ray and Neutron Diffraction: Normalized Self-Consistent Modeling
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Effect of Interlamellar Spacing on the Monotonic Behavior of C70 Pearlitic Steel
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Experimental and Numerical Analysis of Mechanical Behaviour of AISI 316L Austenitic Stainless Steel: Two Level Homogenization – Neutron Diffraction
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HomeAdvanced Materials ResearchAdvanced Materials Research Vol. 996Impact of Shot-Peening on a Single Crystal...

Impact of Shot-Peening on a Single Crystal Nickel-Based Superalloy

Abstract:

Shot-peening is used to improve the lifetime of mechanical components through the introduction of compressive residual stresses (RS) in a surface layer. In this study, we investigate the impact of such a pre-stressing treatment on a single crystal nickel-based superalloy for high pressure turbine blades of engine aircrafts. In addition to conventional metallographic tools used to characterize the alloy microstructure and the zone affected by shot-peening, X-ray measurements have been performed in order to determine residual stress depth profiles.

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Periodical:

Advanced Materials Research (Volume 996)

Pages:

70-75

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.996.70

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Online since:

August 2014

Authors:

Amélie Morancais*, Mathieu Fevre, Manuel François, Pascale Kanoute, Serge Kruch, Arnaud Longuet

Keywords:

Residual Stress, Shot-Peening, Single Crystal, X-Ray Diffraction (XRD)

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* - Corresponding Author

References

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