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HomeAdvances in Science and TechnologyAdvances in Science and Technology Vol. 45Nanoscale Ferroelectrics

Nanoscale Ferroelectrics

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Abstract:

Ferroelectrics are among the most advanced materials for non-volatile storage applications. Their two thermodynamically equivalent groundstates of spontaneous polarization can be toggled between by an external electric field. We present recent progress in the fabrication, registration, manipulation and characterization of nanoscale ferroelectrics. Chemical solution deposition is adapted to a pre-registration process by e-beam lithography to fabricate registered ferroelectric nanostructures below 100 nm width. A post-processing by chemical mechanical polishing either for embedded or free grains modifies the aspect ratio thus controlling the coercive field distribution of nanoferroelectrics. We also discuss some very recent findings of the complex interaction of field and piezoelectric tensor in a real piezoresponse force microscope. This method requires a comprehensive treatment of all contributions to tell apart extrinsic from intrinsic effects.

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Periodical:

Advances in Science and Technology (Volume 45)

Pages:

2392-2399

DOI:

https://doi.org/10.4028/www.scientific.net/AST.45.2392

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Online since:

October 2006

Authors:

Andreas Rüdiger, Rainer Waser

Keywords:

Chemical Solution Deposition, Ferroelectric, Piezoresponse Force Microscopy

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© 2006 Trans Tech Publications Ltd. All Rights Reserved

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[1] T. Schmitz, K. Prume, B. Reichenberg, A. Roelofs, R. Waser and S. Tiedke, J. Eur. Ceram. Soc., 24 (2004), p.1145.

[2] M. Dawber, I. Szafraniak, M. Alexe and J. F. Scott, J. Phys.: Condensed Matter, 15, (2003), p. L667.

[3] T. Schneller and R. Waser, Ferroelectrics, 267, (2002), p.293.

[4] S. Bühlmann, P. Muralt, S. von Allmen, Applied Physics Letters, 84, (2004), p.2614.

[5] S. Clemens, T. Schneller, A. van der Hart, F. Peter and R. Waser, Advanced Materials, 17, (2005), pp.1357-1361.

DOI: 10.1002/adma.200401695

[6] S. Clemens, T. Schneller, R. Waser, A. Rüdiger, F. Peter, S. Kronholz, T. Schmitz and S. Tiedke, Applied Physics Letters, 87, (2005), p.142904.

DOI: 10.1063/1.2084322

[7] S. Clemens, S. Röhrig, A. Rüdiger, T. Schneller and R. Waser, small, 2, (2006), pp.500-502.

[8] A. Rüdiger, T. Schneller, A. Roelofs, S. Tiedke, T. Schmitz, and R. Waser, Applied Physics A, 80, (2005), pp.1247-1255.

DOI: 10.1007/s00339-004-3167-z

[9] M. Alexe, C. Harnagea, D. Hesse, and U. Gösele, Applied Physics Letters, 79, (2001), pp.242-244.

DOI: 10.1063/1.1385184

[10] A. Gruverman, A. Kholkin, A. Kingon, and H. Tokumoto, Applied Physics Letters 78, (2001), pp.2751-2753.

DOI: 10.1063/1.1366644

[11] B. J. Rodriguez, A. Gruverman, A. I. Kingon, R. J. Nemanich, and J. S. Cross, Journal of Applied Physics 95, (2004), p.1958-(1962).

[12] G. Suyal, E. Colla, R. Gysel, M. Cantoni, and N. Setter, Nanoletters 4, (2004), pp.1339-1342.

[13] A. Roelofs, Size Effects in Ferroelectric Thin Films, Dissertation RWTH Aachen (2004).

[14] F. Peter, K. Szot, R. Waser, B. Reichenberg, S. Tiedke, and J. Szade, Applied Physics Letters 85, (2004), p.2896.

DOI: 10.1063/1.1799241

[15] Landolt-Börnstein New Series, vol. III/16a, edited by K. H. Hellwege, Springer Heidelberg, (1981).

[16] F. Peter, A. Rüdiger, R. Dittmann, R. Waser, K. Szot, B. Reichenberg and K. Prume, Applied Physics Letters, 87, (2005), p.082901.

DOI: 10.1063/1.2010603