Relationship Between Microstructure and Hardness of ZrN/TiN Multi-Layers with Various Bilayer Thicknesses

Abstract:

Article Preview

ZrN/TiN multi-layers were synthesized by ion beam sputtering technique. Microstructure and mechanical property of the ZrN/TiN multi-layers were characterized and the relationships between microstructure and hardness of the ZrN/TiN multi-layers with various bilayer thicknesses and thickness ratios were investigated. The microstructure of multi-layers have been investigated using transmission electron microscope (TEM) and X-ray diffraction (XRD).

Info:

Periodical:

Edited by:

Pietro VINCENZINI, Ralf RIEDEL, Alexander G. MERZHANOV and Chang-Chun GE

Pages:

392-395

DOI:

10.4028/www.scientific.net/AST.63.392

Citation:

Y. Aoi et al., "Relationship Between Microstructure and Hardness of ZrN/TiN Multi-Layers with Various Bilayer Thicknesses", Advances in Science and Technology, Vol. 63, pp. 392-395, 2010

Online since:

October 2010

Export:

Price:

$35.00

In order to see related information, you need to Login.

In order to see related information, you need to Login.