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HomeDefect and Diffusion ForumDefect and Diffusion Forum Vols. 103-105Piezocapacitance Spectroscopy of Deep Level...

Piezocapacitance Spectroscopy of Deep Level Centers in Silicon

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Defects in Semiconductors I

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Periodical:

Defect and Diffusion Forum (Volumes 103-105)

Pages:

273-276

DOI:

https://doi.org/10.4028/www.scientific.net/DDF.103-105.273

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Online since:

January 1993

Authors:

Alexander A. Lebedev, W. Ecke, N.A. Sultanov

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© 1993 Trans Tech Publications Ltd. All Rights Reserved

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