Influence Intrinsic Elastic Stresses on the Annealing Processes of Radiation Defects in Silicon

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Periodical:

Defect and Diffusion Forum (Volumes 103-105)

Edited by:

Nickolay T. Bagraev

Pages:

293-298

DOI:

10.4028/www.scientific.net/DDF.103-105.293

Citation:

L. I. Khirunenko et al., "Influence Intrinsic Elastic Stresses on the Annealing Processes of Radiation Defects in Silicon", Defect and Diffusion Forum, Vols. 103-105, pp. 293-298, 1993

Online since:

January 1993

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$35.00

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