Internal Stress Evolution in Multicomponent Thin Metal Films under Electric Current

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Periodical:

Defect and Diffusion Forum (Volumes 129-130)

Edited by:

D.L. Beke and I.A. Szabó

Pages:

215-224

DOI:

10.4028/www.scientific.net/DDF.129-130.215

Citation:

L. M. Klinger et al., "Internal Stress Evolution in Multicomponent Thin Metal Films under Electric Current", Defect and Diffusion Forum, Vols. 129-130, pp. 215-224, 1996

Online since:

March 1996

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Price:

$35.00

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