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HomeDefect and Diffusion ForumDefect and Diffusion Forum Vols. 143-147Electronic Properties of Zn in Si1-xGex Alloys: A...

Electronic Properties of Zn in Si_1-xGe_x Alloys: A Basis for Studying Zn Diffusion in SiGe

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Diffusion in Materials DIMAT 1996

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Periodical:

Defect and Diffusion Forum (Volumes 143-147)

Pages:

1141-1146

DOI:

https://doi.org/10.4028/www.scientific.net/DDF.143-147.1141

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Online since:

January 1997

Authors:

S. Voss, Hartmut Bracht, Nicolaas Stolwijk, Helmut Mehrer, Jürgen Wollweber

Keywords:

DLTS, Electronic Properties, Energy Levels, SiGe Alloys, Zn Diffusion

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© 1997 Trans Tech Publications Ltd. All Rights Reserved

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