Unprecedented Wealth of Information on Guest Dynamics in Nanoporous Materials from Transient Concentration Profiles

Abstract:

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The application of interference microscopy (IFM) and infrared microscopy (IRM) to monitor the evolution of the concentration of guest molecules in nanoporous host materials opens a new field of diffusion research in condensed matter. It combines the methodical virtues of the profiling methods of solid-state diffusion studies with the benefit of the mobility enhancement in fluids. We are going to illustrate the rich options of diffusion studies provided by this novel experimental approach.

Info:

Periodical:

Defect and Diffusion Forum (Volumes 309-310)

Edited by:

B.S. Bokstein, A.O. Rodin and B.B. Straumal

Pages:

177-194

DOI:

10.4028/www.scientific.net/DDF.309-310.177

Citation:

C. Chmelik and J. Kärger, "Unprecedented Wealth of Information on Guest Dynamics in Nanoporous Materials from Transient Concentration Profiles", Defect and Diffusion Forum, Vols. 309-310, pp. 177-194, 2011

Online since:

March 2011

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Price:

$35.00

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