Unprecedented Wealth of Information on Guest Dynamics in Nanoporous Materials from Transient Concentration Profiles
The application of interference microscopy (IFM) and infrared microscopy (IRM) to monitor the evolution of the concentration of guest molecules in nanoporous host materials opens a new field of diffusion research in condensed matter. It combines the methodical virtues of the profiling methods of solid-state diffusion studies with the benefit of the mobility enhancement in fluids. We are going to illustrate the rich options of diffusion studies provided by this novel experimental approach.
B.S. Bokstein, A.O. Rodin and B.B. Straumal
C. Chmelik and J. Kärger, "Unprecedented Wealth of Information on Guest Dynamics in Nanoporous Materials from Transient Concentration Profiles", Defect and Diffusion Forum, Vols. 309-310, pp. 177-194, 2011