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HomeDefect and Diffusion ForumDefect and Diffusion Forum Vols. 309-310Unprecedented Wealth of Information on Guest...

Unprecedented Wealth of Information on Guest Dynamics in Nanoporous Materials from Transient Concentration Profiles

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Abstract:

The application of interference microscopy (IFM) and infrared microscopy (IRM) to monitor the evolution of the concentration of guest molecules in nanoporous host materials opens a new field of diffusion research in condensed matter. It combines the methodical virtues of the profiling methods of solid-state diffusion studies with the benefit of the mobility enhancement in fluids. We are going to illustrate the rich options of diffusion studies provided by this novel experimental approach.

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Periodical:

Defect and Diffusion Forum (Volumes 309-310)

Pages:

177-194

DOI:

https://doi.org/10.4028/www.scientific.net/DDF.309-310.177

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Online since:

March 2011

Authors:

Christian Chmelik, Jörg Kärger

Keywords:

Diffusion, Interference Microscopy, IR Microscopy, Metal-Organic Framework, Nano-Porous Materials, Permeability, Profiling, Surface Resistance, Tracer Technique, Zeolite

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© 2011 Trans Tech Publications Ltd. All Rights Reserved

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