In-House X-Ray Absorption Spectroscopy Measurement Using X-Ray Diffractometer: Comparison with Synchrotron Facilities

Abstract:

X-ray Absorption Spectroscopy (XAS) experiments are usually performed at synchrotron facilities utilizing high-intensity X-ray sources produced by particle accelerators. However, this study showcases an in-house XAS experiment carried out using an X-ray Diffractometer (XRD) system that is typically available in material laboratories. The Rigaku SmartLab XRD was employed and configured for the Bragg-Brentano (BB) measurement mode. 20 keV electron energy is used to energize a molybdenum (Mo) target and produce high-intensity white X-rays via the Bremsstrahlung effect. Several crystals were tested as crystal analyzers for white X-ray dispersion to obtain optimal X-ray intensity and resolution. The detector energy filter is optimized to increase the peak-to-background ratio then the energy dispersion and resolution over the θ/2θ scanning range is determined and evaluated. The performance of the in-house XAS experiment is compared to theoretical calculations and synchrotron data from previous studies by observing resolution and spectrum shape and peak features of deposited Copper (Cu) and Copper Oxide (CuO) samples. Our findings showed that the absorption edges were clearly observed despite the peak broadening and shifting above absorption edge. Furthermore, some peaks were also observed in the XAS spectrum which originated from X-ray fluorescence of elements from both the samples and hardware components.

• Periodical: Engineering Headway (Volume 15)
• Pages: 107-113
• DOI: https://doi.org/10.4028/p-meGLF2
• Online since: January 2025
• Authors: Siti Sarah Saniman, Muhammad Firdaus Omar*
• Keywords: Extended X-Ray Absorption Fine Structure (EXAFS), Thin Film, X-Ray Absorption Fine Structure (XAFS), X-Ray Absorption Spectroscopy (XAS), X-Ray Diffraction (XRD), X-Ray Near Edge Structure (XANES)

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