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HomeJournal of Nano ResearchJournal of Nano Research Vol. 17Synthesis, Structural, Electrical, Magnetic and...

Synthesis, Structural, Electrical, Magnetic and Dielectric Spectroscopic Characterization of C-Er₂Si₂O₇

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Abstract:

The Polymorphic Er₂Si₂O₇ Is Synthesized by Solid State Double Sintering Method. Structural and Morphological Characterizations Have Been Performed Using X-Ray Diffraction (XRD) and Scanning Electron Microscopy (SEM). The Electrical Characterization Has Been Performed by Two Probe Method as a Function of Temperature. the Dielectric Spectroscopic Measurements of Polymorphic Er₂Si₂O₇ Are Performed in the Temperature Range 300-555 K and Frequency Range 3 kHz to 1 MHz. the dc Electrical Transport Data Are Analyzed According to Mott’s Variable-Range Hopping. The ac Conductivity σac(ω) Is Obtained through the Dielectric Spectroscopic Measurements. the ac Conductivity Obeys Power Law which Can Be Expressed as σac (ω) = B ωs, where S Is Slope and it Determines the ac Electrical Transport Phenomenon. the ac Electrical Transport Data and its Variation with Temperature in this Rare Earth Formulation Are Well Discussed. the Magnetic Behavior of Synthesized Material Is Analyzed and Confirmed that Material Have Non-Magnetic Behavior with Coercivity (Hc) 842 Oe. while the Values of Magnetic Saturation (MS) and Remanace (Mr) Were Found in Range 3.90emu/g and 1.07emu/g.

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Journal of Nano Research Vol. 17

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Periodical:

Journal of Nano Research (Volume 17)

Pages:

85-98

DOI:

https://doi.org/10.4028/www.scientific.net/JNanoR.17.85

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Online since:

February 2012

Authors:

Shahid Ameer, Ahmad Faraz, Asghari Maqsood, Nasir M. Ahmad

Keywords:

Dielectric Property, Electrical Properties, Electronic Material, Magnetic Parameters, Remanance (Mr), Saturation Magnetization (Ms), X-Ray Diffraction (XRD)

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© 2012 Trans Tech Publications Ltd. All Rights Reserved

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