Performance Effect of ZnAl₂O₄ - SiO₂ Thin Film for Wireless Patch Antenna Application

Abstract:

Polycrystalline of (1-x)ZnAl₂O₄ – xSiO₂ compound with compositions of x = 0.00, 0.05, 0.10, 0.15, 0.20 and 0.25 have been prepared using sol-gel method. Structural properties was investigated by atomic force microscopy (AFM) and x-ray diffractometer (XRD). The AFM images analysis showed that the surface roughness of the highest composition had rougher surface compared with other samples. XRD measurement indicated that the crystallite size also increased with average crystallite size around 18 nm with cubic phase had been found. The dielectric permittivity value were measured with frequency range of 1 Hz to 1 MHz. It is showed that the dielectric value decreased as the freqeuncy was applied to the samples. The performance of the patch antenna showed that the antenna resonated at 3.30 GHz and give-13.87 dB with frequency range about 2 – 4 GHz.

• Periodical: Journal of Nano Research (Volume 28)
• Pages: 141-150
• DOI: https://doi.org/10.4028/www.scientific.net/JNanoR.28.141
• Online since: June 2014
• Authors: Mohd Syafiq Zulfakar, Huda Abdullah*, Mohammad Tariqul Islam, Wan Nasarudin Wan Jalal, Zalita Zainuddin, Sahbudin Shaari
• Keywords: Dielectric Permittivity, Return Loss, Roughness, Sol-Gel Method

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