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Evaluating Chemical Analysis Techniques: A Comparative Study of SEM-EDX and Optical Emission Spectroscopy

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Abstract:

This study presents a comparative evaluation of two widely used chemical analysis techniques: scanning electron microscopy coupled with energy dispersive X-ray spectroscopy (SEM-EDX) and spectrophotometry. SEM-EDX is renowned for its ability to provide qualitative and quantitative elemental analysis at microscopic levels, making it a powerful tool for material characterization. On the other hand, optical emission spectroscopy, which analyses the light emitted by excited atoms, is highly effective for the rapid and precise quantification of elements in various sample types, especially metals and alloys. The research aims to assess the effectiveness, accuracy, and applicability of these techniques, by analysing identical samples (welding wire) using both SEM-EDX and spectroscopy, this study highlights the strengths and limitations of each method. Key parameters such as sensitivity, detection and data interpretation are compared to provide a comprehensive understanding of their performance in chemical analysis.

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Periodical:

Key Engineering Materials (Volume 1033)

Pages:

107-117

DOI:

https://doi.org/10.4028/p-Hphz0r

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Online since:

November 2025

Authors:

Raluca Faur*, Iuliana Duma, Mihai Florea, Andrei Christian Bucur

Keywords:

Chemical Analysis, Optical Emission Spectroscopy, SEM-EDX, Welding Wire

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© 2025 Trans Tech Publications Ltd. All Rights Reserved

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