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HomeKey Engineering MaterialsKey Engineering Materials Vols. 171-174Creep and Evolution of Dynamic Recrystallization...

Creep and Evolution of Dynamic Recrystallization in Single Crystals of Ti-48at%Al with Different Orientation between Stress Axis and γ Lamellar Plate

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Creep and Fracture of Engineering Materials and Structures

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Periodical:

Key Engineering Materials (Volumes 171-174)

Pages:

639-646

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.171-174.639

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Online since:

October 1999

Authors:

N. Shiratori, S. Hirata, T. Asai, Masao Takeyama, T. Matsuo

Keywords:

Creep, Dynamic Recrystallization (DRX), Lamellar, Single Crystal, Titanium Aluminide

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© 2000 Trans Tech Publications Ltd. All Rights Reserved

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