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HomeKey Engineering MaterialsKey Engineering Materials Vols. 214-215Effects of Deposition Temperature on Structure and...

Effects of Deposition Temperature on Structure and Resistivity of Epitaxial La_0.5Sr_0.5CoO₃/CeO₂/YSZ/Si(001) Films

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Asian Ceramic Science for Electronics I

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Periodical:

Key Engineering Materials (Volumes 214-215)

Pages:

177-182

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.214-215.177

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Online since:

July 2001

Authors:

Chun Hua Chen, Naoki Wakiya, Kazuo Shinozaki, Nobuyasu Mizutani

Keywords:

Electrode, LSCO, Mosaic, Rocking Curve, X-Ray

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© 2002 Trans Tech Publications Ltd. All Rights Reserved

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