Effects of Deposition Temperature on Structure and Resistivity of Epitaxial La0.5Sr0.5CoO3/CeO2/YSZ/Si(001) Films

Abstract:

Article Preview

Info:

Periodical:

Key Engineering Materials (Volumes 214-215)

Edited by:

M. Murata, K. Koumoto and T. Takenaka, S. Fujitsu

Pages:

177-182

DOI:

10.4028/www.scientific.net/KEM.214-215.177

Citation:

C. H. Chen et al., "Effects of Deposition Temperature on Structure and Resistivity of Epitaxial La0.5Sr0.5CoO3/CeO2/YSZ/Si(001) Films", Key Engineering Materials, Vols. 214-215, pp. 177-182, 2002

Online since:

July 2001

Export:

Price:

$35.00

In order to see related information, you need to Login.